{"title":"电子显微镜的图像增强器。","authors":"K Anderson","doi":"10.1088/0022-3735/1/6/303","DOIUrl":null,"url":null,"abstract":"An image intensifier system using a four-stage image intensifier optically coupled to a phosphor screen in the electron microscope is described. The system is shown to be limited by the quantum noise inherent in the electron image. The system can detect images down to 10 fA cm−2 which is at least an order of magnitude better than can be achieved by a fully dark adapted operator viewing the normal fluorescent screen of the microscope.","PeriodicalId":16983,"journal":{"name":"Journal of Scientific Instruments","volume":"2 1","pages":"601-3"},"PeriodicalIF":0.0000,"publicationDate":"1968-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1088/0022-3735/1/6/303","citationCount":"11","resultStr":"{\"title\":\"An image intensifier for the electron microscope.\",\"authors\":\"K Anderson\",\"doi\":\"10.1088/0022-3735/1/6/303\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An image intensifier system using a four-stage image intensifier optically coupled to a phosphor screen in the electron microscope is described. The system is shown to be limited by the quantum noise inherent in the electron image. The system can detect images down to 10 fA cm−2 which is at least an order of magnitude better than can be achieved by a fully dark adapted operator viewing the normal fluorescent screen of the microscope.\",\"PeriodicalId\":16983,\"journal\":{\"name\":\"Journal of Scientific Instruments\",\"volume\":\"2 1\",\"pages\":\"601-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1968-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1088/0022-3735/1/6/303\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Scientific Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0022-3735/1/6/303\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0022-3735/1/6/303","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An image intensifier system using a four-stage image intensifier optically coupled to a phosphor screen in the electron microscope is described. The system is shown to be limited by the quantum noise inherent in the electron image. The system can detect images down to 10 fA cm−2 which is at least an order of magnitude better than can be achieved by a fully dark adapted operator viewing the normal fluorescent screen of the microscope.