{"title":"用于光弹性分析的透射显微镜偏光镜。","authors":"D J White, A S Tickner","doi":"10.1088/0022-3735/1/6/316","DOIUrl":null,"url":null,"abstract":"The construction is described of a special purpose instrument for photoelastic analysis with use of the frozen stress technique. Consideration is given to the methods of analysis employed with the microscope polariscope, and its limitations and potentialities in respect of oblique incidence analysis are discussed.","PeriodicalId":16983,"journal":{"name":"Journal of Scientific Instruments","volume":"2 1","pages":"649-51"},"PeriodicalIF":0.0000,"publicationDate":"1968-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1088/0022-3735/1/6/316","citationCount":"3","resultStr":"{\"title\":\"A transmission microscope polarioscope for photoelastic analysis.\",\"authors\":\"D J White, A S Tickner\",\"doi\":\"10.1088/0022-3735/1/6/316\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The construction is described of a special purpose instrument for photoelastic analysis with use of the frozen stress technique. Consideration is given to the methods of analysis employed with the microscope polariscope, and its limitations and potentialities in respect of oblique incidence analysis are discussed.\",\"PeriodicalId\":16983,\"journal\":{\"name\":\"Journal of Scientific Instruments\",\"volume\":\"2 1\",\"pages\":\"649-51\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1968-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1088/0022-3735/1/6/316\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Scientific Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0022-3735/1/6/316\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0022-3735/1/6/316","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A transmission microscope polarioscope for photoelastic analysis.
The construction is described of a special purpose instrument for photoelastic analysis with use of the frozen stress technique. Consideration is given to the methods of analysis employed with the microscope polariscope, and its limitations and potentialities in respect of oblique incidence analysis are discussed.