{"title":"cvd金刚石脱毛膜窄带深紫外传感器。","authors":"Manish Singh Rautela,Taslim Khan,Santanu Kandar,Shivansh Tiwari,D G Kuberkar,Chirag Limbasiya,Sunil Patel,Rajendra Singh","doi":"10.1021/acsami.5c17069","DOIUrl":null,"url":null,"abstract":"In technological applications, encrypted communication and environmental monitoring require specific wavelength detection. As technology advances, the capacity to precisely detect and use distinct wavelengths improves system security, efficiency, and accuracy. The following study introduces a thermally resilient metal-semiconductor-metal deep UV photodetector (MSM DUV PD) fabricated on CVD-grown diamond and demonstrates its properties as a narrowband PD in the DUV range having an advantage over conventional broadband PDs, which require wavelength filters. The fabricated MSM device exhibited a narrow spectral response in the DUV region with an FWHM of 14.4 nm having a peak responsivity at 210 nm wavelength under 5 V bias and maintained the narrowband detection functionality at elevated temperatures up to 423 K. On studying the diamond's cathodoluminescence and photoluminescence properties, it was concluded that radiative and nonradiative recombination via trap energy states in the forbidden band was responsible for narrowband detection. Further, the device exhibits a self-biased operational mode, having a low dark current of 10-14 A, a detectivity of 2.64 × 1011 Jones, a noise equivalent power of 1.4 × 10-13 W/Hz1/2, and a response time of 0.8 s, demonstrating superior operations to detect weak signals from background noise. This study puts forward the potential of CVD-grown diamond as a promising candidate for narrowband DUV photodetection.","PeriodicalId":5,"journal":{"name":"ACS Applied Materials & Interfaces","volume":"29 1","pages":""},"PeriodicalIF":8.2000,"publicationDate":"2025-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Narrowband Deep UV Sensor on CVD-Grown Diamond Epilayers.\",\"authors\":\"Manish Singh Rautela,Taslim Khan,Santanu Kandar,Shivansh Tiwari,D G Kuberkar,Chirag Limbasiya,Sunil Patel,Rajendra Singh\",\"doi\":\"10.1021/acsami.5c17069\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In technological applications, encrypted communication and environmental monitoring require specific wavelength detection. As technology advances, the capacity to precisely detect and use distinct wavelengths improves system security, efficiency, and accuracy. The following study introduces a thermally resilient metal-semiconductor-metal deep UV photodetector (MSM DUV PD) fabricated on CVD-grown diamond and demonstrates its properties as a narrowband PD in the DUV range having an advantage over conventional broadband PDs, which require wavelength filters. The fabricated MSM device exhibited a narrow spectral response in the DUV region with an FWHM of 14.4 nm having a peak responsivity at 210 nm wavelength under 5 V bias and maintained the narrowband detection functionality at elevated temperatures up to 423 K. On studying the diamond's cathodoluminescence and photoluminescence properties, it was concluded that radiative and nonradiative recombination via trap energy states in the forbidden band was responsible for narrowband detection. Further, the device exhibits a self-biased operational mode, having a low dark current of 10-14 A, a detectivity of 2.64 × 1011 Jones, a noise equivalent power of 1.4 × 10-13 W/Hz1/2, and a response time of 0.8 s, demonstrating superior operations to detect weak signals from background noise. This study puts forward the potential of CVD-grown diamond as a promising candidate for narrowband DUV photodetection.\",\"PeriodicalId\":5,\"journal\":{\"name\":\"ACS Applied Materials & Interfaces\",\"volume\":\"29 1\",\"pages\":\"\"},\"PeriodicalIF\":8.2000,\"publicationDate\":\"2025-10-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Materials & Interfaces\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1021/acsami.5c17069\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Materials & Interfaces","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1021/acsami.5c17069","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Narrowband Deep UV Sensor on CVD-Grown Diamond Epilayers.
In technological applications, encrypted communication and environmental monitoring require specific wavelength detection. As technology advances, the capacity to precisely detect and use distinct wavelengths improves system security, efficiency, and accuracy. The following study introduces a thermally resilient metal-semiconductor-metal deep UV photodetector (MSM DUV PD) fabricated on CVD-grown diamond and demonstrates its properties as a narrowband PD in the DUV range having an advantage over conventional broadband PDs, which require wavelength filters. The fabricated MSM device exhibited a narrow spectral response in the DUV region with an FWHM of 14.4 nm having a peak responsivity at 210 nm wavelength under 5 V bias and maintained the narrowband detection functionality at elevated temperatures up to 423 K. On studying the diamond's cathodoluminescence and photoluminescence properties, it was concluded that radiative and nonradiative recombination via trap energy states in the forbidden band was responsible for narrowband detection. Further, the device exhibits a self-biased operational mode, having a low dark current of 10-14 A, a detectivity of 2.64 × 1011 Jones, a noise equivalent power of 1.4 × 10-13 W/Hz1/2, and a response time of 0.8 s, demonstrating superior operations to detect weak signals from background noise. This study puts forward the potential of CVD-grown diamond as a promising candidate for narrowband DUV photodetection.
期刊介绍:
ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.