Shaowei Wang , Hongliang Lu , Silu Yan , Lin Cheng , Yanghui Hu , Longxiang He , Liu Wang , Yuming Zhang
{"title":"用矢量拟合方法改进GaN hemt的小信号建模","authors":"Shaowei Wang , Hongliang Lu , Silu Yan , Lin Cheng , Yanghui Hu , Longxiang He , Liu Wang , Yuming Zhang","doi":"10.1016/j.mejo.2025.106912","DOIUrl":null,"url":null,"abstract":"<div><div>In the paper, an improved small-signal equivalent circuit model for GaN HEMTs is proposed for effectively capturing the high-frequency behavior of the device. In order to simulate the gain flatness of the device at high frequencies, the intrinsic capacitive coupling noise characteristic at high frequencies is considered in the proposed model. Also, in order to consider the phase delay phenomenon present in the device at high frequency conditions, additional current sources are added to the proposed model to simulate the phenomenon. In addition, the parameter values in the model are obtained by analyzing the rational function poles, residuals, and constants extracted by vector fitting (VF), which accurately models the <em>Y</em>-parameter characteristics of the device at high frequencies. The proposed model can accurately model the main physical properties of the device with good physical consistency and parameter interpretability. With the help of the VF, the model realizes high-precision matching of the <em>Y</em>-parameters of the device in a wide frequency band while significantly reducing the complexity of parameter extraction.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"166 ","pages":"Article 106912"},"PeriodicalIF":1.9000,"publicationDate":"2025-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving small signal modeling of GaN HEMTs with vector fitting method\",\"authors\":\"Shaowei Wang , Hongliang Lu , Silu Yan , Lin Cheng , Yanghui Hu , Longxiang He , Liu Wang , Yuming Zhang\",\"doi\":\"10.1016/j.mejo.2025.106912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In the paper, an improved small-signal equivalent circuit model for GaN HEMTs is proposed for effectively capturing the high-frequency behavior of the device. In order to simulate the gain flatness of the device at high frequencies, the intrinsic capacitive coupling noise characteristic at high frequencies is considered in the proposed model. Also, in order to consider the phase delay phenomenon present in the device at high frequency conditions, additional current sources are added to the proposed model to simulate the phenomenon. In addition, the parameter values in the model are obtained by analyzing the rational function poles, residuals, and constants extracted by vector fitting (VF), which accurately models the <em>Y</em>-parameter characteristics of the device at high frequencies. The proposed model can accurately model the main physical properties of the device with good physical consistency and parameter interpretability. With the help of the VF, the model realizes high-precision matching of the <em>Y</em>-parameters of the device in a wide frequency band while significantly reducing the complexity of parameter extraction.</div></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":\"166 \",\"pages\":\"Article 106912\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1879239125003613\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125003613","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Improving small signal modeling of GaN HEMTs with vector fitting method
In the paper, an improved small-signal equivalent circuit model for GaN HEMTs is proposed for effectively capturing the high-frequency behavior of the device. In order to simulate the gain flatness of the device at high frequencies, the intrinsic capacitive coupling noise characteristic at high frequencies is considered in the proposed model. Also, in order to consider the phase delay phenomenon present in the device at high frequency conditions, additional current sources are added to the proposed model to simulate the phenomenon. In addition, the parameter values in the model are obtained by analyzing the rational function poles, residuals, and constants extracted by vector fitting (VF), which accurately models the Y-parameter characteristics of the device at high frequencies. The proposed model can accurately model the main physical properties of the device with good physical consistency and parameter interpretability. With the help of the VF, the model realizes high-precision matching of the Y-parameters of the device in a wide frequency band while significantly reducing the complexity of parameter extraction.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.