换流站复杂电压波形中直流分量对ZnO压敏电阻缺陷结构和电性能的影响

IF 2.8 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Tao Song, Xia Zhao, Nianwen Xiang, Peng Kang, Ziming He, Chaoqun Wang, Chenglin Xu
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引用次数: 0

摘要

在特高压直流(UHVDC)系统中,换流站中的ZnO压敏电阻承受由叠加直流电压和高次谐波组成的复杂电压波形。在这种条件下,ZnO压敏电阻可以承受恶劣的工作条件。本文利用高电位变换器阀侧(A2)的复杂波形对直流ZnO压敏电阻片在135℃下进行不同直流分量下的老化试验,然后对老化试样进行135℃下的热恢复试验,研究直流分量对ZnO压敏电阻缺陷结构和电性能的影响。在试验过程中,分析了电性能、缺陷结构、双肖特基势垒的变化。结果表明,随着A2波形直流分量的增加,材料的电学性能并不是单调恶化的,这一现象可以用电子填充界面态和亚稳离子迁移的过程来解释。本文将工作电压扩展到击穿区域,为ZnO压敏电阻的老化机理提供了新的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of DC component in complex voltage waveforms from converter stations on defect structure and electrical performance of ZnO varistors

In the ultra-high voltage direct current (UHVDC) system, ZnO varistors in converter stations are subjected to complex voltage waveforms comprising superimposed DC voltages and high-order harmonics. Under such conditions, ZnO varistors may endure severe operational condition. This paper conducts aging tests on DC ZnO varistor discs at 135 °C using complex waveforms from the high-potential converter valve side (A2) under varying DC components, followed by thermal recovery tests on the aged specimens at 135 °C, to investigate the impact of DC components on the defect structure and electrical performance of ZnO varistors.During the tests, changes in electrical properties, defect structures, double Schottky barriers are analyzed. The results suggest that the electrical properties do not worsen monotonically with the increase of the DC component of the A2 waveform and the phenomenon can be explained by combining the processes of filling the interface states by electrons and migration of metastable ions. This paper extension of the operational voltage to the breakdown region, this work provides novel insights into aging mechanisms of ZnO varistors.

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来源期刊
Applied Physics A
Applied Physics A 工程技术-材料科学:综合
CiteScore
4.80
自引率
7.40%
发文量
964
审稿时长
38 days
期刊介绍: Applied Physics A publishes experimental and theoretical investigations in applied physics as regular articles, rapid communications, and invited papers. The distinguished 30-member Board of Editors reflects the interdisciplinary approach of the journal and ensures the highest quality of peer review.
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