Aljoša Hafner, Luca Costa, George Kourousias, Valentina Bonanni, Milan Žižić, Andrea Stolfa, Benjamin Bazi, Laszlo Vincze, Alessandra Gianoncelli
{"title":"修正:一个创新的原位AFM系统的软x射线光谱显微镜同步加速器光束线","authors":"Aljoša Hafner, Luca Costa, George Kourousias, Valentina Bonanni, Milan Žižić, Andrea Stolfa, Benjamin Bazi, Laszlo Vincze, Alessandra Gianoncelli","doi":"10.1039/d5an90066b","DOIUrl":null,"url":null,"abstract":"Correction for ‘An innovative <em>in situ</em> AFM system for a soft X-ray spectromicroscopy synchrotron beamline’ by Aljoša Hafner <em>et al.</em>, <em>Analyst</em>, 2024, <strong>149</strong>, 700–706, https://doi.org/10.1039/D3AN01358H.","PeriodicalId":63,"journal":{"name":"Analyst","volume":"54 1","pages":""},"PeriodicalIF":3.3000,"publicationDate":"2025-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Correction: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline\",\"authors\":\"Aljoša Hafner, Luca Costa, George Kourousias, Valentina Bonanni, Milan Žižić, Andrea Stolfa, Benjamin Bazi, Laszlo Vincze, Alessandra Gianoncelli\",\"doi\":\"10.1039/d5an90066b\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Correction for ‘An innovative <em>in situ</em> AFM system for a soft X-ray spectromicroscopy synchrotron beamline’ by Aljoša Hafner <em>et al.</em>, <em>Analyst</em>, 2024, <strong>149</strong>, 700–706, https://doi.org/10.1039/D3AN01358H.\",\"PeriodicalId\":63,\"journal\":{\"name\":\"Analyst\",\"volume\":\"54 1\",\"pages\":\"\"},\"PeriodicalIF\":3.3000,\"publicationDate\":\"2025-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Analyst\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1039/d5an90066b\",\"RegionNum\":3,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, ANALYTICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Analyst","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1039/d5an90066b","RegionNum":3,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
Correction: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline
Correction for ‘An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline’ by Aljoša Hafner et al., Analyst, 2024, 149, 700–706, https://doi.org/10.1039/D3AN01358H.