蒸发Ph-BTBT-10薄膜相变及其对器件性能的影响

IF 4.4 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Lamiaa Fijahi, Shunya Yan, Ann Maria James, Min Zhang, Alba Cazorla, Adrián Tamayo, Jinghai Li, Carmen Ocal, Esther Barrena, Roland Resel, Marta Mas-Torrent
{"title":"蒸发Ph-BTBT-10薄膜相变及其对器件性能的影响","authors":"Lamiaa Fijahi,&nbsp;Shunya Yan,&nbsp;Ann Maria James,&nbsp;Min Zhang,&nbsp;Alba Cazorla,&nbsp;Adrián Tamayo,&nbsp;Jinghai Li,&nbsp;Carmen Ocal,&nbsp;Esther Barrena,&nbsp;Roland Resel,&nbsp;Marta Mas-Torrent","doi":"10.1002/admi.202500599","DOIUrl":null,"url":null,"abstract":"<p>This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-ray reflectivity (XRR) studies reveal that the films crystallize in a single-layer structure, which converts to a bilayer phase in the temperature range of 110°C –140°C; at further elevated temperatures, a liquid-crystal phase is formed. The conversion of the as-evaporated films to the bilayer structure is investigated by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) at specific annealing temperatures. The combination of XRR, AFM, and KPFM points out that only at the higher annealing temperature the phase transformation is completed. In a subsequent stage, the films are investigated as active layers in OFETs. An enhanced performance is observed in the annealed films with a higher mobility and reduced level of charge traps. The best electrical characteristics are realized when the bilayer transformation is fully accomplished.</p>","PeriodicalId":115,"journal":{"name":"Advanced Materials Interfaces","volume":"12 19","pages":""},"PeriodicalIF":4.4000,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/admi.202500599","citationCount":"0","resultStr":"{\"title\":\"Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance\",\"authors\":\"Lamiaa Fijahi,&nbsp;Shunya Yan,&nbsp;Ann Maria James,&nbsp;Min Zhang,&nbsp;Alba Cazorla,&nbsp;Adrián Tamayo,&nbsp;Jinghai Li,&nbsp;Carmen Ocal,&nbsp;Esther Barrena,&nbsp;Roland Resel,&nbsp;Marta Mas-Torrent\",\"doi\":\"10.1002/admi.202500599\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-ray reflectivity (XRR) studies reveal that the films crystallize in a single-layer structure, which converts to a bilayer phase in the temperature range of 110°C –140°C; at further elevated temperatures, a liquid-crystal phase is formed. The conversion of the as-evaporated films to the bilayer structure is investigated by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) at specific annealing temperatures. The combination of XRR, AFM, and KPFM points out that only at the higher annealing temperature the phase transformation is completed. In a subsequent stage, the films are investigated as active layers in OFETs. An enhanced performance is observed in the annealed films with a higher mobility and reduced level of charge traps. The best electrical characteristics are realized when the bilayer transformation is fully accomplished.</p>\",\"PeriodicalId\":115,\"journal\":{\"name\":\"Advanced Materials Interfaces\",\"volume\":\"12 19\",\"pages\":\"\"},\"PeriodicalIF\":4.4000,\"publicationDate\":\"2025-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/admi.202500599\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Materials Interfaces\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://advanced.onlinelibrary.wiley.com/doi/10.1002/admi.202500599\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Materials Interfaces","FirstCategoryId":"88","ListUrlMain":"https://advanced.onlinelibrary.wiley.com/doi/10.1002/admi.202500599","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

本文报道了有机半导体2-癸基-7-苯基[1]苯并噻吩[3,2-b][1]苯并噻吩(Ph-BTBT-10)蒸发薄膜中发生的相变及其对有机薄膜场效应晶体管(ofet)性能的影响。温度相关的x射线反射率(XRR)研究表明,薄膜以单层结构结晶,在110°C -140°C的温度范围内转变为双层相;在进一步升高的温度下,形成液晶相。利用原子力显微镜(AFM)和开尔文探针力显微镜(KPFM)研究了在特定退火温度下蒸发态薄膜向双层结构的转变。结合XRR、AFM和KPFM分析表明,只有在较高的退火温度下,相变才会完成。在随后的阶段,研究这些薄膜作为ofet中的有源层。退火后的薄膜具有更高的迁移率和更低的电荷陷阱。当双层转换完全完成时,实现了最佳的电特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance

Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance

This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-ray reflectivity (XRR) studies reveal that the films crystallize in a single-layer structure, which converts to a bilayer phase in the temperature range of 110°C –140°C; at further elevated temperatures, a liquid-crystal phase is formed. The conversion of the as-evaporated films to the bilayer structure is investigated by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) at specific annealing temperatures. The combination of XRR, AFM, and KPFM points out that only at the higher annealing temperature the phase transformation is completed. In a subsequent stage, the films are investigated as active layers in OFETs. An enhanced performance is observed in the annealed films with a higher mobility and reduced level of charge traps. The best electrical characteristics are realized when the bilayer transformation is fully accomplished.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Advanced Materials Interfaces
Advanced Materials Interfaces CHEMISTRY, MULTIDISCIPLINARY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
8.40
自引率
5.60%
发文量
1174
审稿时长
1.3 months
期刊介绍: Advanced Materials Interfaces publishes top-level research on interface technologies and effects. Considering any interface formed between solids, liquids, and gases, the journal ensures an interdisciplinary blend of physics, chemistry, materials science, and life sciences. Advanced Materials Interfaces was launched in 2014 and received an Impact Factor of 4.834 in 2018. The scope of Advanced Materials Interfaces is dedicated to interfaces and surfaces that play an essential role in virtually all materials and devices. Physics, chemistry, materials science and life sciences blend to encourage new, cross-pollinating ideas, which will drive forward our understanding of the processes at the interface. Advanced Materials Interfaces covers all topics in interface-related research: Oil / water separation, Applications of nanostructured materials, 2D materials and heterostructures, Surfaces and interfaces in organic electronic devices, Catalysis and membranes, Self-assembly and nanopatterned surfaces, Composite and coating materials, Biointerfaces for technical and medical applications. Advanced Materials Interfaces provides a forum for topics on surface and interface science with a wide choice of formats: Reviews, Full Papers, and Communications, as well as Progress Reports and Research News.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信