Le Zhang, Ao Li, Qibin Hou, Ce Zhu, Yonina C. Eldar
{"title":"基于深度学习的超分辨率:综合调查与未来展望","authors":"Le Zhang, Ao Li, Qibin Hou, Ce Zhu, Yonina C. Eldar","doi":"10.1109/jproc.2025.3613233","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"64 1","pages":""},"PeriodicalIF":25.9000,"publicationDate":"2025-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deep-Learning-Empowered Super Resolution: A Comprehensive Survey and Future Prospects\",\"authors\":\"Le Zhang, Ao Li, Qibin Hou, Ce Zhu, Yonina C. Eldar\",\"doi\":\"10.1109/jproc.2025.3613233\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":20556,\"journal\":{\"name\":\"Proceedings of the IEEE\",\"volume\":\"64 1\",\"pages\":\"\"},\"PeriodicalIF\":25.9000,\"publicationDate\":\"2025-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/jproc.2025.3613233\",\"RegionNum\":1,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/jproc.2025.3613233","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
期刊介绍:
Proceedings of the IEEE is the leading journal to provide in-depth review, survey, and tutorial coverage of the technical developments in electronics, electrical and computer engineering, and computer science. Consistently ranked as one of the top journals by Impact Factor, Article Influence Score and more, the journal serves as a trusted resource for engineers around the world.