对“超薄PtSe2电子结构的准确评估：带隙量化和金属-半导体过渡的临界厚度”的修正

IF 8.2 2区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY

ACS Applied Materials & Interfaces Pub Date : 2025-10-08 DOI:10.1021/acsami.5c18563

Hansung Kim, Janghwan Cha, Jong Hyeok Seo, Beopgil Cho, Jaemun Park, Keeseong Park, Kenji Watanabe, Takashi Taniguchi, Dong Han Ha, Jihwan Kwon, Sunae Seo, Yong-Sung Kim, Suyong Jung

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引用次数: 0

摘要

在我们的原始论文中，Hansung Kim的作者归属是不正确的。原隶属于韩国标准科学研究院化学与材料计量部，韩国大田34113。正确的隶属关系是韩国标准科学研究院化学与材料计量部，大田34113，韩国；世宗大学物理与天文学系，首尔05006，韩国。这篇文章尚未被其他出版物引用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Correction to “Accurate Assessments of the Electronic Structures of Ultrathin PtSe2: Bandgap Quantification and Critical Thickness for the Metal–Semiconductor Transition”

In our original paper, the author affiliation for Hansung Kim is incorrect. The original affiliation is Division of Chemical and Material Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea. The corrected affiliation is Division of Chemical and Material Metrology, Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea and Department of Physics and Astronomy, Sejong University, Seoul 05006, Republic of Korea. This article has not yet been cited by other publications.

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来源期刊

ACS Applied Materials & Interfaces 工程技术-材料科学：综合

CiteScore

16.00

自引率

6.30%

发文量

4978

审稿时长

1.8 months

期刊介绍： ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.