现代实验室型粉末衍射仪在透射几何中的原位研究

IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Simon M. Vornholt, John J. Ferrari, Bryan A. Sanchez Monserrate, Bryce G. Mullens, Jan Hofmann, Michelle L. Beauvais, Peter J. Chupas, Karena W. Chapman
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引用次数: 0

摘要

为了研究材料的结构-功能关系,原位x射线散射实验传统上依赖于明亮的同步x射线来解决快速的动态现象,并有效地探测结构作为环境变量的函数。然而,最近的技术进步扩大了实验室衍射仪器的用途。在这里,我们展示了一个现代化的实验室x射线衍射仪器,配备了光子计数区域探测器(EIGER2)和微聚焦Mo x射线源(Incoatec IµS),可以有效地补充同步加速器,弥合同步加速器实验的时间分辨率与室内实验之间的差距。具体来说,在2-3分钟内获得定量粉末衍射数据的能力使动态过程的时间分辨研究和适用于固态转化的时间尺度上的有效参数研究成为可能。传输测量几何使用平行于同步加速器的区域探测器,允许复杂的实验和新的样品环境开发在转移到同步加速器光束线进行粉末衍射和/或对分布函数分析之前在内部原型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Benchmarking a modern laboratory-based powder diffraction instrument for in situ studies in transmission geometry

Benchmarking a modern laboratory-based powder diffraction instrument for in situ studies in transmission geometry

In situ X-ray scattering experiments, to study structure–function relationships in materials, have traditionally relied on bright synchrotron X-rays to resolve fast dynamic phenomena and efficiently probe structure as a function of environmental variables. However, recent technological advances have expanded the utility of laboratory-based diffraction instruments. Here we demonstrate how a modern laboratory-based X-ray diffraction instrument, equipped with a photon-counting area detector (EIGER2) and microfocus Mo X-ray source (Incoatec IµS), can effectively complement synchrotrons, bridging the gap between the time resolution of synchrotron-based experiments and what can be achieved in house. Specifically, the ability to acquire quantitative powder diffraction data within 2–3 min enables time-resolved studies of dynamic processes and efficient parametric studies on timescales suitable for solid-state transformations. The transmission measurement geometry using an area detector parallels that used at synchrotrons, allowing complex experiments and new sample environment developments to be prototyped in house before being transferred to synchrotron beamlines for powder diffraction and/or pair distribution function analysis.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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