x射线应力分析中自由表面、x射线弹性常数模型和取向分布函数影响的计算与实验研究

IF 2.8 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Thomas Gnaupel-Herold, Adam Creuziger
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引用次数: 0

摘要

x射线应力分析需要精确的x射线弹性常数(xec)。XEC计算面临的挑战之一是建模方法、首选方向以及在较小程度上影响结果的自由表面。在这项工作中,我们调查了这些因素。表面效应是在这样的假设下计算的,即在一个表面层内,由面内应力引起的沿法向的泊松作用必须不受由于自由表面导致的在法向的晶粒-基体相互作用的阻碍。对模型在零侵彻和层厚等于晶粒尺寸时的纯表面效应进行了评估;后者计算为表面颗粒层与体体的衰减加权深度平均值。在不同晶格平面(hkl)、不同x射线波长和不同穿透深度下,与其他XEC模型和实测的XEC进行了进一步的比较。通过晶粒取向分布函数(ODF)的变化研究了择优取向的影响。结果表明,纯表面效应模型效果最好。ODF的变化可以显著影响个体(hkl)的xec,而对(hkl)平均值的影响较小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Computational and experimental investigation into the effect of the free surface, X-ray elastic constant  model and orientation distribution function used in X-ray stress analysis

Computational and experimental investigation into the effect of the free surface, X-ray elastic constant model and orientation distribution function used in X-ray stress analysis

X-ray stress analysis requires accurate X-ray elastic constants (XECs). One of the challenges for XEC calculation is that the modelling approach, preferred orientation and, to a lesser extent, the free surface affect the result. In this work, we investigate these factors. The surface effect is calculated under the assumption that within a surface layer the Poisson action along the normal direction caused by in-plane stresses must not be impeded by grain–matrix interaction in the normal direction due to the free surface. The model is evaluated for the pure surface effect for zero penetration and for a layer thickness equal to the grain size; the latter is calculated as the attenuation-weighted depth average of the surface grain layer and the bulk. Further comparisons are made with other XEC models and with measured XECs for different lattice planes (hkl), different X-ray wavelengths and varying penetration depths. The effect of preferred orientation is studied through variations of the grain orientation distribution function (ODF). It was found that the pure-surface-effect model performed best. ODF variations can significantly affect the XECs of individual (hkl), while the effect on the (hkl) average appears small.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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