多层电子平面摄影的视场深度：研究能量和会聚角。

IF 1.9 4区工程技术 Q3 MICROSCOPY

Journal of microscopy Pub Date : 2025-10-06 DOI:10.1111/jmi.70039

Frederick Allars, Andrew Maiden, Darren J. Batey, Christopher S. Allen

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引用次数: 0

摘要

近年来，由于在原子结构的超高分辨率、深度分辨率成像方面取得了显著的实验成功，多层电子平面摄影引起了人们的极大兴趣。然而，景深对实验参数的理论依赖性还没有得到很好的理解。本文利用仿真数据比较了在不同加速电压和收敛角下，通焦环形暗场和多层电子平面摄影的景深。我们发现，在低会聚角和低电子能量下，多层平面成像通过焦ADF成像显着提高了景深。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle

查看原文本刊更多论文

Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle

Multi-slice electron ptychography has attracted significant interest in recent years, thanks to notable experimental successes in ultra-high resolution, depth-resolved imaging of atomic structure. However, the theoretical dependence of depth of field on experimental parameters is not well understood. In this paper we use simulated data to compare the depth of field of through focal annular-dark field and multi-slice electron ptychography over a range of acceleration voltages and convergence angles. We show that at both low convergence angle and at low electron energy, multi-slice ptychography has significantly improved depth of field over through focal ADF imaging.

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来源期刊

Journal of microscopy 工程技术-显微镜技术

CiteScore

4.30

自引率

5.00%

发文量

审稿时长

1 months

期刊介绍： The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.