{"title":"基于Deutsch量子算法的变压器内部故障检测","authors":"Surajit Chattopadhyay, Aditya Narayan Banerjee, Aritra Chattopadhyay, Santanu Chattopadhyay, Goutam Dalapati","doi":"10.1007/s11664-025-12306-7","DOIUrl":null,"url":null,"abstract":"<div><p>This paper deals with a quantum algorithm for internal fault detection of a classical electrical system. Quantum computing is growing rapidly, offering many computational advantages along with enhanced security options. In this work, an attempt has been made to resolve a well-known classical problem using quantum computation. A classical system consisting of a multiphase transformer connected with power and load buses has been considered as a system. The objective has been set to detect whether any internal fault has occurred in the system. Though a classical solution exists using a differential protection scheme, here the same problem has been detected using a quantum algorithm. The result and analysis show that the system at healthy and fault conditions can be modeled using a quantum circuit, and together with a quantum algorithm, can be effectively applied to detect whether the fault has occurred internally to the system. Use of quantum computation-based fault discrimination involves less computational complexity. Moreover, the proposed quantum monitoring system can be used for fault detection that inherently offers secure transmission of fault information in quantum states.</p></div>","PeriodicalId":626,"journal":{"name":"Journal of Electronic Materials","volume":"54 11","pages":"9537 - 9545"},"PeriodicalIF":2.5000,"publicationDate":"2025-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deutsch Quantum Algorithm-Based Detection of Internal Fault in a Transformer\",\"authors\":\"Surajit Chattopadhyay, Aditya Narayan Banerjee, Aritra Chattopadhyay, Santanu Chattopadhyay, Goutam Dalapati\",\"doi\":\"10.1007/s11664-025-12306-7\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This paper deals with a quantum algorithm for internal fault detection of a classical electrical system. Quantum computing is growing rapidly, offering many computational advantages along with enhanced security options. In this work, an attempt has been made to resolve a well-known classical problem using quantum computation. A classical system consisting of a multiphase transformer connected with power and load buses has been considered as a system. The objective has been set to detect whether any internal fault has occurred in the system. Though a classical solution exists using a differential protection scheme, here the same problem has been detected using a quantum algorithm. The result and analysis show that the system at healthy and fault conditions can be modeled using a quantum circuit, and together with a quantum algorithm, can be effectively applied to detect whether the fault has occurred internally to the system. Use of quantum computation-based fault discrimination involves less computational complexity. Moreover, the proposed quantum monitoring system can be used for fault detection that inherently offers secure transmission of fault information in quantum states.</p></div>\",\"PeriodicalId\":626,\"journal\":{\"name\":\"Journal of Electronic Materials\",\"volume\":\"54 11\",\"pages\":\"9537 - 9545\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2025-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Materials\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s11664-025-12306-7\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s11664-025-12306-7","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Deutsch Quantum Algorithm-Based Detection of Internal Fault in a Transformer
This paper deals with a quantum algorithm for internal fault detection of a classical electrical system. Quantum computing is growing rapidly, offering many computational advantages along with enhanced security options. In this work, an attempt has been made to resolve a well-known classical problem using quantum computation. A classical system consisting of a multiphase transformer connected with power and load buses has been considered as a system. The objective has been set to detect whether any internal fault has occurred in the system. Though a classical solution exists using a differential protection scheme, here the same problem has been detected using a quantum algorithm. The result and analysis show that the system at healthy and fault conditions can be modeled using a quantum circuit, and together with a quantum algorithm, can be effectively applied to detect whether the fault has occurred internally to the system. Use of quantum computation-based fault discrimination involves less computational complexity. Moreover, the proposed quantum monitoring system can be used for fault detection that inherently offers secure transmission of fault information in quantum states.
期刊介绍:
The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications.
Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field.
A journal of The Minerals, Metals & Materials Society.