添加SiNx缓冲层及优化位置和厚度对Cu2ZnSn(S,Se)4太阳能电池性能的改善

IF 3.6 4区 工程技术 Q3 ENERGY & FUELS
Yuting Sun, Guanxin Yan, Bin Yao, Yongqin Hao, Yongfeng Li, Zhanhui Ding, Jiayong Zhang, Chunkai Wang, Ding Ma, Mengge Li
{"title":"添加SiNx缓冲层及优化位置和厚度对Cu2ZnSn(S,Se)4太阳能电池性能的改善","authors":"Yuting Sun,&nbsp;Guanxin Yan,&nbsp;Bin Yao,&nbsp;Yongqin Hao,&nbsp;Yongfeng Li,&nbsp;Zhanhui Ding,&nbsp;Jiayong Zhang,&nbsp;Chunkai Wang,&nbsp;Ding Ma,&nbsp;Mengge Li","doi":"10.1002/ente.202500083","DOIUrl":null,"url":null,"abstract":"<p>Many results have demonstrated that high interfacial recombination is one of the main leading to low power conversion efficiency (PCE) of Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> (CZTSSe). Herein, interfacial recombination of CZTSSe solar cell by addition of silicon nitride (SiN<sub><i>x</i></sub>) buffer layer in front interface of CdS/CZTSSe and back interface of CZTSSe/Mo is reduced. It is found that the PCE decreases sharply when the SiN<sub><i>x</i></sub> layer is deposited at the front interface. Quantitative analysis indicates that the decreased PCE is mainly attributed to the decrease in photogeneration density (<i>J</i><sub>L</sub>), followed by increase in reverse saturation current density (<i>J</i><sub>0</sub>). However, when the SiN<sub><i>x</i></sub> layer is deposited at the back interface, the PCE increases from 9.11 to 9.78% as the thickness of the SiN<sub><i>x</i></sub> increases from 0 to 5 nm. Quantitative analysis indicates that the increased PCE is mainly attributed to the increase in <i>J</i><sub>L</sub>, followed by the decrease in <i>J</i><sub>0</sub> and series resistance (<i>R</i><sub>s</sub>). This work provides a reference for the study of using SiN<sub><i>x</i></sub> passivation to improve the efficiency of CZTSSe or other solar cells.</p>","PeriodicalId":11573,"journal":{"name":"Energy technology","volume":"13 10","pages":""},"PeriodicalIF":3.6000,"publicationDate":"2025-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improvement of Performance of Cu2ZnSn(S,Se)4 Solar Cells by Adding SiNx Buffer Layer and Optimizing its Position and Thickness\",\"authors\":\"Yuting Sun,&nbsp;Guanxin Yan,&nbsp;Bin Yao,&nbsp;Yongqin Hao,&nbsp;Yongfeng Li,&nbsp;Zhanhui Ding,&nbsp;Jiayong Zhang,&nbsp;Chunkai Wang,&nbsp;Ding Ma,&nbsp;Mengge Li\",\"doi\":\"10.1002/ente.202500083\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Many results have demonstrated that high interfacial recombination is one of the main leading to low power conversion efficiency (PCE) of Cu<sub>2</sub>ZnSn(S,Se)<sub>4</sub> (CZTSSe). Herein, interfacial recombination of CZTSSe solar cell by addition of silicon nitride (SiN<sub><i>x</i></sub>) buffer layer in front interface of CdS/CZTSSe and back interface of CZTSSe/Mo is reduced. It is found that the PCE decreases sharply when the SiN<sub><i>x</i></sub> layer is deposited at the front interface. Quantitative analysis indicates that the decreased PCE is mainly attributed to the decrease in photogeneration density (<i>J</i><sub>L</sub>), followed by increase in reverse saturation current density (<i>J</i><sub>0</sub>). However, when the SiN<sub><i>x</i></sub> layer is deposited at the back interface, the PCE increases from 9.11 to 9.78% as the thickness of the SiN<sub><i>x</i></sub> increases from 0 to 5 nm. Quantitative analysis indicates that the increased PCE is mainly attributed to the increase in <i>J</i><sub>L</sub>, followed by the decrease in <i>J</i><sub>0</sub> and series resistance (<i>R</i><sub>s</sub>). This work provides a reference for the study of using SiN<sub><i>x</i></sub> passivation to improve the efficiency of CZTSSe or other solar cells.</p>\",\"PeriodicalId\":11573,\"journal\":{\"name\":\"Energy technology\",\"volume\":\"13 10\",\"pages\":\"\"},\"PeriodicalIF\":3.6000,\"publicationDate\":\"2025-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Energy technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/ente.202500083\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENERGY & FUELS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Energy technology","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/ente.202500083","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENERGY & FUELS","Score":null,"Total":0}
引用次数: 0

摘要

许多结果表明,高界面复合是导致Cu2ZnSn(S,Se)4 (CZTSSe)低功率转换效率(PCE)的主要原因之一。通过在CdS/CZTSSe的前界面和CZTSSe/Mo的后界面添加氮化硅(SiNx)缓冲层,减少了CZTSSe太阳能电池的界面复合。发现在前界面沉积SiNx层时,PCE急剧下降。定量分析表明,PCE的降低主要是由于光致密度(JL)的降低,其次是反向饱和电流密度(J0)的增加。而当后界面沉积SiNx层时,随着SiNx厚度从0 nm增加到5 nm, PCE从9.11增加到9.78%。定量分析表明,PCE的增加主要是由于JL的增加,其次是J0和串联电阻(Rs)的降低。本工作为利用SiNx钝化提高CZTSSe或其他太阳能电池效率的研究提供了参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Improvement of Performance of Cu2ZnSn(S,Se)4 Solar Cells by Adding SiNx Buffer Layer and Optimizing its Position and Thickness

Improvement of Performance of Cu2ZnSn(S,Se)4 Solar Cells by Adding SiNx Buffer Layer and Optimizing its Position and Thickness

Many results have demonstrated that high interfacial recombination is one of the main leading to low power conversion efficiency (PCE) of Cu2ZnSn(S,Se)4 (CZTSSe). Herein, interfacial recombination of CZTSSe solar cell by addition of silicon nitride (SiNx) buffer layer in front interface of CdS/CZTSSe and back interface of CZTSSe/Mo is reduced. It is found that the PCE decreases sharply when the SiNx layer is deposited at the front interface. Quantitative analysis indicates that the decreased PCE is mainly attributed to the decrease in photogeneration density (JL), followed by increase in reverse saturation current density (J0). However, when the SiNx layer is deposited at the back interface, the PCE increases from 9.11 to 9.78% as the thickness of the SiNx increases from 0 to 5 nm. Quantitative analysis indicates that the increased PCE is mainly attributed to the increase in JL, followed by the decrease in J0 and series resistance (Rs). This work provides a reference for the study of using SiNx passivation to improve the efficiency of CZTSSe or other solar cells.

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来源期刊
Energy technology
Energy technology ENERGY & FUELS-
CiteScore
7.00
自引率
5.30%
发文量
0
审稿时长
1.3 months
期刊介绍: Energy Technology provides a forum for researchers and engineers from all relevant disciplines concerned with the generation, conversion, storage, and distribution of energy. This new journal shall publish articles covering all technical aspects of energy process engineering from different perspectives, e.g., new concepts of energy generation and conversion; design, operation, control, and optimization of processes for energy generation (e.g., carbon capture) and conversion of energy carriers; improvement of existing processes; combination of single components to systems for energy generation; design of systems for energy storage; production processes of fuels, e.g., hydrogen, electricity, petroleum, biobased fuels; concepts and design of devices for energy distribution.
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