{"title":"SAINT-IIOT:麋鹿群优化的深度学习模型,可在IIoT中高效检测异常","authors":"K. Mahalakshmi , B. Jaison","doi":"10.1016/j.asej.2025.103625","DOIUrl":null,"url":null,"abstract":"<div><div>Industrial Internet of Things (IIoT) is an innovative technology that may mitigate manufacturing costs, increase production efficiency, and foster the growth of industrial intelligence. IIoT applications face security and privacy risks as a result of IIoT device abnormalities reveal sensitive information with high authenticity and validity. To address these issues, a novel cascaded Stacked Autoencoder INtegrated aTtention CNN-BiGRU for IIoT (SAINT-IIoT) model has been proposed in this paper to improve the real-time detection of cyber threats in IIoT environments. The proposed methodology employs an Elk Herd Optimization (EHO) algorithm for effectively selecting the features, which address the issue of irrelevant and noisy features. The Deep Learning (DL) technique is used for real-time anomaly classification to handle complex, nonlinear, and time-dependent attack patterns that traditional models often fail to identify. The accuracy of the suggested framework is 7.04%, 12.11%, and 3.26% higher than the existing techniques including DRL-GAN, AIm-ADS, and EPOA-EVAD.</div></div>","PeriodicalId":48648,"journal":{"name":"Ain Shams Engineering Journal","volume":"16 12","pages":"Article 103625"},"PeriodicalIF":5.9000,"publicationDate":"2025-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SAINT-IIOT: Elk herd optimized deep learning model for efficient anomaly detection in the IIoT\",\"authors\":\"K. Mahalakshmi , B. Jaison\",\"doi\":\"10.1016/j.asej.2025.103625\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Industrial Internet of Things (IIoT) is an innovative technology that may mitigate manufacturing costs, increase production efficiency, and foster the growth of industrial intelligence. IIoT applications face security and privacy risks as a result of IIoT device abnormalities reveal sensitive information with high authenticity and validity. To address these issues, a novel cascaded Stacked Autoencoder INtegrated aTtention CNN-BiGRU for IIoT (SAINT-IIoT) model has been proposed in this paper to improve the real-time detection of cyber threats in IIoT environments. The proposed methodology employs an Elk Herd Optimization (EHO) algorithm for effectively selecting the features, which address the issue of irrelevant and noisy features. The Deep Learning (DL) technique is used for real-time anomaly classification to handle complex, nonlinear, and time-dependent attack patterns that traditional models often fail to identify. The accuracy of the suggested framework is 7.04%, 12.11%, and 3.26% higher than the existing techniques including DRL-GAN, AIm-ADS, and EPOA-EVAD.</div></div>\",\"PeriodicalId\":48648,\"journal\":{\"name\":\"Ain Shams Engineering Journal\",\"volume\":\"16 12\",\"pages\":\"Article 103625\"},\"PeriodicalIF\":5.9000,\"publicationDate\":\"2025-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ain Shams Engineering Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S2090447925003661\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ain Shams Engineering Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2090447925003661","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
SAINT-IIOT: Elk herd optimized deep learning model for efficient anomaly detection in the IIoT
Industrial Internet of Things (IIoT) is an innovative technology that may mitigate manufacturing costs, increase production efficiency, and foster the growth of industrial intelligence. IIoT applications face security and privacy risks as a result of IIoT device abnormalities reveal sensitive information with high authenticity and validity. To address these issues, a novel cascaded Stacked Autoencoder INtegrated aTtention CNN-BiGRU for IIoT (SAINT-IIoT) model has been proposed in this paper to improve the real-time detection of cyber threats in IIoT environments. The proposed methodology employs an Elk Herd Optimization (EHO) algorithm for effectively selecting the features, which address the issue of irrelevant and noisy features. The Deep Learning (DL) technique is used for real-time anomaly classification to handle complex, nonlinear, and time-dependent attack patterns that traditional models often fail to identify. The accuracy of the suggested framework is 7.04%, 12.11%, and 3.26% higher than the existing techniques including DRL-GAN, AIm-ADS, and EPOA-EVAD.
期刊介绍:
in Shams Engineering Journal is an international journal devoted to publication of peer reviewed original high-quality research papers and review papers in both traditional topics and those of emerging science and technology. Areas of both theoretical and fundamental interest as well as those concerning industrial applications, emerging instrumental techniques and those which have some practical application to an aspect of human endeavor, such as the preservation of the environment, health, waste disposal are welcome. The overall focus is on original and rigorous scientific research results which have generic significance.
Ain Shams Engineering Journal focuses upon aspects of mechanical engineering, electrical engineering, civil engineering, chemical engineering, petroleum engineering, environmental engineering, architectural and urban planning engineering. Papers in which knowledge from other disciplines is integrated with engineering are especially welcome like nanotechnology, material sciences, and computational methods as well as applied basic sciences: engineering mathematics, physics and chemistry.