Shoug M. Alghamdi, Ayesha Hanif, Rasmiah S. Almufarij, Elsammani Ali Shokralla, M. D. Alshahrani, Islam Ragab, Mohamed Abdelsabour Fahmy, Abdulaziz M. Alanazi, Adnan Ali, Arslan Ashfaq
{"title":"钴掺杂调节β-FeSi2薄膜的微观结构和热电响应","authors":"Shoug M. Alghamdi, Ayesha Hanif, Rasmiah S. Almufarij, Elsammani Ali Shokralla, M. D. Alshahrani, Islam Ragab, Mohamed Abdelsabour Fahmy, Abdulaziz M. Alanazi, Adnan Ali, Arslan Ashfaq","doi":"10.1007/s10854-025-15897-3","DOIUrl":null,"url":null,"abstract":"<div><p>In this study, Co-doped β-FeSi<sub>2</sub> thin films were successfully synthesized using a simple thermal evaporation technique followed by post-annealing at 500 °C to explore their thermoelectric properties. The structural analysis confirmed the orthorhombic β-FeSi<sub>2</sub> phase with prominent diffraction peaks corresponding to the (220), (200), and (311) planes. The peak intensity increased with Co content up to x = 0.25, followed by a decline at x = 0.35, indicating improved crystallinity at moderate doping and structural disorder at higher concentrations. SEM images revealed a systematic microstructural evolution from nanoneedle-like morphology to granular agglomerates, consistent with XRD findings. Thermoelectric measurements showed that the Seebeck coefficient decreased with increasing the cobalt content due to higher carrier concentration, while electrical conductivity improved up to x = 0.25, owing to enhanced mobility and grain connectivity. The highest power factor of 11.39 µW/mK<sup>2</sup> at 550 K was achieved for the x = 0.25 sample, confirming the optimal doping level. This work highlights the significance of controlled cobalt doping in enhancing the thermoelectric performance of β-FeSi<sub>2</sub> thin films and provides insight into the interplay between microstructure and carrier transport.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 28","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tuning the Microstructure and Thermoelectric Response of β-FeSi2 Thin Films via Cobalt Doping\",\"authors\":\"Shoug M. Alghamdi, Ayesha Hanif, Rasmiah S. Almufarij, Elsammani Ali Shokralla, M. D. Alshahrani, Islam Ragab, Mohamed Abdelsabour Fahmy, Abdulaziz M. Alanazi, Adnan Ali, Arslan Ashfaq\",\"doi\":\"10.1007/s10854-025-15897-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>In this study, Co-doped β-FeSi<sub>2</sub> thin films were successfully synthesized using a simple thermal evaporation technique followed by post-annealing at 500 °C to explore their thermoelectric properties. The structural analysis confirmed the orthorhombic β-FeSi<sub>2</sub> phase with prominent diffraction peaks corresponding to the (220), (200), and (311) planes. The peak intensity increased with Co content up to x = 0.25, followed by a decline at x = 0.35, indicating improved crystallinity at moderate doping and structural disorder at higher concentrations. SEM images revealed a systematic microstructural evolution from nanoneedle-like morphology to granular agglomerates, consistent with XRD findings. Thermoelectric measurements showed that the Seebeck coefficient decreased with increasing the cobalt content due to higher carrier concentration, while electrical conductivity improved up to x = 0.25, owing to enhanced mobility and grain connectivity. The highest power factor of 11.39 µW/mK<sup>2</sup> at 550 K was achieved for the x = 0.25 sample, confirming the optimal doping level. This work highlights the significance of controlled cobalt doping in enhancing the thermoelectric performance of β-FeSi<sub>2</sub> thin films and provides insight into the interplay between microstructure and carrier transport.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 28\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-025-15897-3\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-15897-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Tuning the Microstructure and Thermoelectric Response of β-FeSi2 Thin Films via Cobalt Doping
In this study, Co-doped β-FeSi2 thin films were successfully synthesized using a simple thermal evaporation technique followed by post-annealing at 500 °C to explore their thermoelectric properties. The structural analysis confirmed the orthorhombic β-FeSi2 phase with prominent diffraction peaks corresponding to the (220), (200), and (311) planes. The peak intensity increased with Co content up to x = 0.25, followed by a decline at x = 0.35, indicating improved crystallinity at moderate doping and structural disorder at higher concentrations. SEM images revealed a systematic microstructural evolution from nanoneedle-like morphology to granular agglomerates, consistent with XRD findings. Thermoelectric measurements showed that the Seebeck coefficient decreased with increasing the cobalt content due to higher carrier concentration, while electrical conductivity improved up to x = 0.25, owing to enhanced mobility and grain connectivity. The highest power factor of 11.39 µW/mK2 at 550 K was achieved for the x = 0.25 sample, confirming the optimal doping level. This work highlights the significance of controlled cobalt doping in enhancing the thermoelectric performance of β-FeSi2 thin films and provides insight into the interplay between microstructure and carrier transport.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.