Paolo Frigerio;Roberto Carminati;Luca Molinari;Marco Zamprogno;Giacomo Langfelder
{"title":"基于MEMS反射镜的光栅扫描系统的数字辅助标定与控制","authors":"Paolo Frigerio;Roberto Carminati;Luca Molinari;Marco Zamprogno;Giacomo Langfelder","doi":"10.1109/JMEMS.2025.3584552","DOIUrl":null,"url":null,"abstract":"This work discloses the implementation of a raster-scanning projection system based on MEMS micromirrors, including predictor-based control and an embedded recalibration feature. The system is designed to target an image of <inline-formula> <tex-math>$1280\\times 720$ </tex-math></inline-formula> pixels. Two separate mirrors are used to steer a single, modulated, laser source across the screen: one, operated at its resonance frequency, performs a sinusoidal horizontal scan, while the second, operated in the quasi-static regime, performs the vertical scan. The maximum frame rate at the target resolution is 60 Hz when bidirectional scanning is exploited. The amplitude and frequency errors of the horizontal scan are 18.5 mdeg and 52 ppm, respectively, while the linearity of the vertical scan is 3.4 mdeg, i.e., 580 ppm of the field-of-view, with a mean frame-to-frame reproducibility of 5.5 mdeg. [2025-0068]","PeriodicalId":16621,"journal":{"name":"Journal of Microelectromechanical Systems","volume":"34 5","pages":"636-644"},"PeriodicalIF":3.1000,"publicationDate":"2025-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11079700","citationCount":"0","resultStr":"{\"title\":\"Digitally-Assisted Calibration and Control of a Raster-Scanning System Based on MEMS Mirrors\",\"authors\":\"Paolo Frigerio;Roberto Carminati;Luca Molinari;Marco Zamprogno;Giacomo Langfelder\",\"doi\":\"10.1109/JMEMS.2025.3584552\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work discloses the implementation of a raster-scanning projection system based on MEMS micromirrors, including predictor-based control and an embedded recalibration feature. The system is designed to target an image of <inline-formula> <tex-math>$1280\\\\times 720$ </tex-math></inline-formula> pixels. Two separate mirrors are used to steer a single, modulated, laser source across the screen: one, operated at its resonance frequency, performs a sinusoidal horizontal scan, while the second, operated in the quasi-static regime, performs the vertical scan. The maximum frame rate at the target resolution is 60 Hz when bidirectional scanning is exploited. The amplitude and frequency errors of the horizontal scan are 18.5 mdeg and 52 ppm, respectively, while the linearity of the vertical scan is 3.4 mdeg, i.e., 580 ppm of the field-of-view, with a mean frame-to-frame reproducibility of 5.5 mdeg. [2025-0068]\",\"PeriodicalId\":16621,\"journal\":{\"name\":\"Journal of Microelectromechanical Systems\",\"volume\":\"34 5\",\"pages\":\"636-644\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2025-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11079700\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Microelectromechanical Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11079700/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Microelectromechanical Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11079700/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Digitally-Assisted Calibration and Control of a Raster-Scanning System Based on MEMS Mirrors
This work discloses the implementation of a raster-scanning projection system based on MEMS micromirrors, including predictor-based control and an embedded recalibration feature. The system is designed to target an image of $1280\times 720$ pixels. Two separate mirrors are used to steer a single, modulated, laser source across the screen: one, operated at its resonance frequency, performs a sinusoidal horizontal scan, while the second, operated in the quasi-static regime, performs the vertical scan. The maximum frame rate at the target resolution is 60 Hz when bidirectional scanning is exploited. The amplitude and frequency errors of the horizontal scan are 18.5 mdeg and 52 ppm, respectively, while the linearity of the vertical scan is 3.4 mdeg, i.e., 580 ppm of the field-of-view, with a mean frame-to-frame reproducibility of 5.5 mdeg. [2025-0068]
期刊介绍:
The topics of interest include, but are not limited to: devices ranging in size from microns to millimeters, IC-compatible fabrication techniques, other fabrication techniques, measurement of micro phenomena, theoretical results, new materials and designs, micro actuators, micro robots, micro batteries, bearings, wear, reliability, electrical interconnections, micro telemanipulation, and standards appropriate to MEMS. Application examples and application oriented devices in fluidics, optics, bio-medical engineering, etc., are also of central interest.