二维电子学用无机分子晶体高κ介电材料的高通量计算设计。

IF 16 1区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
ACS Nano Pub Date : 2025-10-01 DOI:10.1021/acsnano.5c12416
Tong Yang,Jingyu He,Keda Ding,Ke Yang,Wei Han,Minggang Zeng,Yulin Yang,Jiong Zhao,Yang Chai,Shu Ping Lau,Kian Ping Loh,Jun Zhou,Ming Yang
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引用次数: 0

摘要

无机分子晶体(IMCs)由于其无键悬垂表面和在二维半导体上直接集成的能力,作为二维(2D)电子器件的高κ介电体具有很大的前景。然而,到目前为止,仅确定了有限数量的imc,并且基于imc的高κ介电体和2D半导体之间的界面特性在很大程度上仍未被探索。在这里,我们从一个大型材料数据库中高效地筛选了基于imc的高κ介电材料,其中6种imc (Sb2S2O9,两个Bi2O3相,As2S2O9, Sb2O3和Te2H2O3F4)被预测为最有前途的2D半导体栅极介电材料,因为它们在介电常数和带隙之间具有最佳的权衡,并且易于生长。对于主要的二维半导体通道材料,如二硫化钼(MoS2)和黑磷烯(BP),已经确定了各自有前途的基于imc的高κ介电体。我们进一步展示了两种高性能的2D半导体/IMC接口(BP/Sb2S2O9和MoS2/Bi2O3),证明了大波段偏移,高缺陷容限和低泄漏电流。在动态随机存取存储器(DRAM)和中央处理器(CPU)应用中,imc的缩小能力也被揭示为低于1纳米的等效氧化物厚度(EOT)。我们的研究结果加速了基于imc的高κ介电体的探索,促进了高性能二维电子学的发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-Throughput Computational Design of Inorganic Molecular Crystal-Based High-κ Dielectrics for Two-Dimensional Electronics.
Inorganic molecular crystals (IMCs) hold great promise as high-κ dielectrics for two-dimensional (2D) electronics due to their dangling-bond-free surfaces and the capability of direct integration on 2D semiconductors. However, only a limited number of IMCs have been identified so far, and interface properties between IMC-based high-κ dielectrics and 2D semiconductors remain largely unexplored. Here, we present an efficient high-throughput screening of IMC-based high-κ dielectrics from a large materials database, of which 6 IMCs (Sb2S2O9, two Bi2O3 phases, As2S2O9, Sb2O3, and Te2H2O3F4) have been predicted to be the most promising gate dielectrics for 2D semiconductors due to their optimal trade-off between dielectric constant and band gap, as well as facile growth possibility. For predominant 2D semiconducting channel materials such as molybdenum disulfide (MoS2) and black phosphorene (BP), the respective promising IMC-based high-κ dielectrics have been pinpointed. We further showcase two high-performance 2D semiconductor/IMC interfaces (BP/Sb2S2O9 and MoS2/Bi2O3), as evidenced by large band offsets, high defect tolerance, and low leakage current. The downscaling capability of the IMCs to the sub-1 nm equivalent oxide thickness (EOT) regime is also unraveled for both dynamic random access memory (DRAM) and central processing unit (CPU) applications. Our results accelerate the exploration of IMC-based high-κ dielectrics and promote the development of high-performance 2D electronics.
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来源期刊
ACS Nano
ACS Nano 工程技术-材料科学:综合
CiteScore
26.00
自引率
4.10%
发文量
1627
审稿时长
1.7 months
期刊介绍: ACS Nano, published monthly, serves as an international forum for comprehensive articles on nanoscience and nanotechnology research at the intersections of chemistry, biology, materials science, physics, and engineering. The journal fosters communication among scientists in these communities, facilitating collaboration, new research opportunities, and advancements through discoveries. ACS Nano covers synthesis, assembly, characterization, theory, and simulation of nanostructures, nanobiotechnology, nanofabrication, methods and tools for nanoscience and nanotechnology, and self- and directed-assembly. Alongside original research articles, it offers thorough reviews, perspectives on cutting-edge research, and discussions envisioning the future of nanoscience and nanotechnology.
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