Dhruv Gamdha, Ryan Fair, Adarsh Krishnamurthy, Enrique D. Gomez and Baskar Ganapathysubramanian
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GRATEv2 employs fast, automated image processing algorithms, enabling rapid extraction of structural features like <em>d</em>-spacing, orientation, and crystal shape metrics. Bayesian optimization rapidly identifies the parameters (that are traditionally user-defined) in the approach, reducing the need for manual parameter tuning and thus enhancing reproducibility and usability. Additionally, GRATEv2 is compatible with high-performance computing (HPC) environments, allowing for efficient, large-scale data processing at near real-time speeds. A unique feature of GRATEv2 is a Wasserstein distance-based stopping criterion, which optimizes data collection by determining when further sampling no longer adds statistically significant information. This capability optimizes the amount of time the TEM facility is used while ensuring data adequacy for in-depth analysis. Open-source and tested on a substantial PCDTBT dataset, this tool offers a powerful, robust, and accessible solution for high-throughput material characterization in organic electronics.</p>","PeriodicalId":18242,"journal":{"name":"Materials Advances","volume":" 19","pages":" 6820-6842"},"PeriodicalIF":4.7000,"publicationDate":"2025-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.rsc.org/en/content/articlepdf/2025/ma/d5ma00409h?page=search","citationCount":"0","resultStr":"{\"title\":\"GRATEv2: computational tools for real-time analysis of high-throughput high-resolution TEM (HRTEM) images of conjugated polymers\",\"authors\":\"Dhruv Gamdha, Ryan Fair, Adarsh Krishnamurthy, Enrique D. 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引用次数: 0
摘要
高分辨率透射电子显微镜(HRTEM)图像的自动分析对于推进有机电子学的研究越来越重要,在有机电子学中,对共轭聚合物中的片层、一维晶体域的精确表征决定了器件的性能。本文介绍了一个开源的计算框架——gratev2 (GRaph-based Analysis of TEM, Version 2),专为半晶体、聚合物微观结构的近实时分析而设计;它的性能在聚[N-9 ' -庚烷-2,7-咔唑-氨基-5,5-(4 ',7 ' -二-2-噻唑-2 ',1 ',3 ' -苯并噻唑)](pcdbt)上得到了证明,pcdbt是有机光伏的基准材料。GRATEv2采用快速、自动化的图像处理算法,能够快速提取结构特征,如d间距、方向和晶体形状指标。贝叶斯优化快速识别方法中的参数(传统上是用户定义的),减少了手动参数调优的需要,从而增强了可重复性和可用性。此外,GRATEv2与高性能计算(HPC)环境兼容,允许以接近实时的速度进行高效、大规模的数据处理。GRATEv2的一个独特功能是基于Wasserstein距离的停止准则,该准则通过确定何时进一步采样不再添加统计显著信息来优化数据收集。该功能优化了TEM工具的使用时间,同时确保了深入分析的数据充分性。开源并在大量pcdbt数据集上进行了测试,该工具为有机电子中的高通量材料表征提供了强大,稳健和可访问的解决方案。
GRATEv2: computational tools for real-time analysis of high-throughput high-resolution TEM (HRTEM) images of conjugated polymers
Automated analysis of high-resolution transmission electron microscopy (HRTEM) images is increasingly essential for advancing research in organic electronics, where precise characterization of lamellar, one-dimensional crystalline domains in conjugated polymers governs device performance. This paper introduces an open-source computational framework—GRATEv2 (GRaph-based Analysis of TEM, Version 2)—designed for near-real-time analysis of semi-crystalline, polymeric microstructures; its capabilities are illustrated on poly[N-9′-heptadecanyl-2,7-carbazole-alt-5,5-(4′,7′-di-2-thienyl-2′,1′,3′-benzothiadiazole)] (PCDTBT), a benchmark material in organic photovoltaics. GRATEv2 employs fast, automated image processing algorithms, enabling rapid extraction of structural features like d-spacing, orientation, and crystal shape metrics. Bayesian optimization rapidly identifies the parameters (that are traditionally user-defined) in the approach, reducing the need for manual parameter tuning and thus enhancing reproducibility and usability. Additionally, GRATEv2 is compatible with high-performance computing (HPC) environments, allowing for efficient, large-scale data processing at near real-time speeds. A unique feature of GRATEv2 is a Wasserstein distance-based stopping criterion, which optimizes data collection by determining when further sampling no longer adds statistically significant information. This capability optimizes the amount of time the TEM facility is used while ensuring data adequacy for in-depth analysis. Open-source and tested on a substantial PCDTBT dataset, this tool offers a powerful, robust, and accessible solution for high-throughput material characterization in organic electronics.