高分辨率光学显微镜在复杂的环境与单像素探测器

IF 3.6 2区 物理与天体物理 Q2 PHYSICS, APPLIED
Tianshun Zhang, Yang Peng, Wen Chen
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引用次数: 0

摘要

由于严重的光衰减和波退化,光学显微镜在强散射环境中面临着挑战。在这里,我们报告了在复杂环境中使用单像素检测器的高分辨率光学显微镜。通过将微型随机图案投射到标本上,可以通过单像素检测同步收集一系列光强度。在复杂散射环境中,浊度的动态变化会引起非线性衰减。提出了一种由物理模型增强的未经训练的神经网络框架,用于估计一系列散射引起的缩放因子并实现高分辨率的目标重建。所设计的光学显微镜系统,采用可调镜头和自动对焦,也被用于重建高质量和高分辨率的图像在不同的视场的生物标本对抗复杂的和动态的散射。实验证明了该方法的有效性和鲁棒性,为光学显微镜研究动态介质中复杂散射提供了一种可行的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-resolution optical microscopy in complex environments with a single-pixel detector
Optical microscopy faces a challenge in strongly scattering environments due to severe light attenuation and wave degradation. Here, we report high-resolution optical microscopy in complex environments with a single-pixel detector. By projecting miniaturized random patterns onto a specimen, a series of light intensities can be synchronously collected via single-pixel detection. Dynamic variations in the turbidity in complex scattering environments induce nonlinear attenuations. A framework of untrained neural networks enhanced by a physical model is developed to estimate a series of scattering-induced scaling factors and achieve high-resolution object reconstruction. The designed optical microscopy system, employing a tunable lens with autofocusing, is also applied to reconstruct high-quality and high-resolution images of biological specimens over varying fields of view against complex and dynamic scattering. It is demonstrated in experiments that the proposed method is effective and robust, providing a viable approach for optical microscopy through complex scattering in dynamic media.
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来源期刊
Applied Physics Letters
Applied Physics Letters 物理-物理:应用
CiteScore
6.40
自引率
10.00%
发文量
1821
审稿时长
1.6 months
期刊介绍: Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.
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