溶液法制备掺钡Sb2S3硫系薄膜的相位调谐及光电性能

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Ali AK. Bakly, Xiang Li Zhong, Salih Abbas Habeeb
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引用次数: 0

摘要

合成了锑乙基黄药(1)和钡异丙基黄药(2)作为单源前驱体(ssp),制备了溶液法制备ba掺杂Sb2S3薄膜。将溶液自旋涂覆在玻璃衬底上,550℃退火1.5 h,合成了(Sb2S3)薄膜(0≤x≤100)mol% Ba和(BaS)薄膜,(Sb2S3)薄膜在250℃退火1 h。采用p-XRD、EDX、ICP、拉曼光谱、SEM、TEM和电阻率测量(ρ)对薄膜的组成、结构、形貌、光学和电学性能进行了表征。(p-XRD)分析表明,(Sb2S3)薄膜具有显性(210)取向的正交结构。Ba的掺入诱导了逐渐的相变;(103)取向在中间掺杂时得到促进,在高掺杂水平时被修饰成立方(111)ba相。在50 mol% Ba时,SEM显示层状形貌。利用(EDX)和(ICP)验证了Sb, Ba和S的存在,证实了完整的分解和相纯度,与x射线衍射(XRD)和拉曼结果一致。从Tauc图中估计的光带隙(Eg)范围为1.7 eV (Sb2S3)至3.85 eV (BaS),表明光电性能可调。电阻率随Ba含量的增加而增加。(BaS)的电阻率升高(18.4 Ω cm),与(Sb2S3)相比电导率降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Phase tuning and optoelectronic properties of solution-processed Ba-doped Sb2S3 chalcogenide thin films

Antimony ethyl xanthate (1) and barium isopropyl xanthate (2) were synthesised and used as single-source precursors (SSPs) to prepare solution-processed Ba-doped Sb2S3 films. Ternary Sb2-xBaxS3 films (0 ≤ x ≤ 100) mol% Ba and (BaS) film were synthesised by spin-coating the solution on glass substrates and annealing at 550 °C for 1.5 h, and (Sb2S3) films were annealed at 250 °C for 1 h. Compositional, structural, morphological, optical, and electrical properties were characterised by p-XRD, EDX, ICP, Raman spectroscopy, SEM, TEM, and resistivity measurements (ρ). (p-XRD) reveals that the (Sb2S3) film has an orthorhombic structure with a dominant (210) orientation. Ba incorporation induced a progressive phase transition; the (103) orientation was promoted at intermediate doping, and it was modified into a cubic (111) BaS phase at higher doping levels. SEM shows lamellar morphology at 50 mol% Ba. The existence of Sb, Ba, and S was verified using (EDX) and (ICP), confirming intact decomposition and phase purity, consistent with the X-ray diffraction (XRD) and Raman results. The optical bandgap (Eg), estimated from Tauc plots, ranged from 1.7 eV (Sb2S3) to 3.85 eV (BaS), indicating tunable optoelectronic properties. Resistivity increased with Ba content. (BaS) exhibited a raised resistivity (18.4 Ω cm), showing reduced conductivity compared to (Sb2S3).

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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