探索层状GeSe单晶的光探测特性

IF 2.8 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Megha Patel, Abhishek Patel, Mohit Tannarana, Pratik M. Pataniya, Chetan Zankat, Ankurkumar J. Khimani, G. K. Solanki
{"title":"探索层状GeSe单晶的光探测特性","authors":"Megha Patel,&nbsp;Abhishek Patel,&nbsp;Mohit Tannarana,&nbsp;Pratik M. Pataniya,&nbsp;Chetan Zankat,&nbsp;Ankurkumar J. Khimani,&nbsp;G. K. Solanki","doi":"10.1007/s00339-025-08915-y","DOIUrl":null,"url":null,"abstract":"<div><p>The lamellar Transition metal chalcogenides (TMC) semiconductors from IV-VI group have attracted researchers due to their tunable properties. Here, the author demonstrated the growth of GeSe single crystals using direct vapour transport (DVT) technique. The structural property of grown crystals is studied by powder X-ray diffraction (PXRD). The transmission electron microscopy (TEM) of the grown crystal revealed that the grown material is single-crystalline. UV-Visible-NIR (UV-VIS-NIR) spectroscopy is carried out to study the band gap of GeSe crystal. The vibrational modes of GeSe are studied by RAMAN spectroscopy. The photodetector based on GeSe crystal is fabricated and its temporal photoresponse is studied under 670 nm Light of power intensity 3 mW/cm<sup>2</sup> and white Light of different intensities. The detector showed a fast response with a response time 0.1 s. The photocurrent 30.222 µA is achieved under 670 nm Light. In addition, the enhanced photoresponsivity of 105.79 mA W<sup>−1</sup> and specific detectivity of 4.80 × 10<sup>10</sup> Jones are also achieved under 670 nm laser illumination with 3 mW/cm<sup>2</sup>.</p></div>","PeriodicalId":473,"journal":{"name":"Applied Physics A","volume":"131 10","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Exploring the photodetection properties of layered GeSe single-crystal\",\"authors\":\"Megha Patel,&nbsp;Abhishek Patel,&nbsp;Mohit Tannarana,&nbsp;Pratik M. Pataniya,&nbsp;Chetan Zankat,&nbsp;Ankurkumar J. Khimani,&nbsp;G. K. Solanki\",\"doi\":\"10.1007/s00339-025-08915-y\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The lamellar Transition metal chalcogenides (TMC) semiconductors from IV-VI group have attracted researchers due to their tunable properties. Here, the author demonstrated the growth of GeSe single crystals using direct vapour transport (DVT) technique. The structural property of grown crystals is studied by powder X-ray diffraction (PXRD). The transmission electron microscopy (TEM) of the grown crystal revealed that the grown material is single-crystalline. UV-Visible-NIR (UV-VIS-NIR) spectroscopy is carried out to study the band gap of GeSe crystal. The vibrational modes of GeSe are studied by RAMAN spectroscopy. The photodetector based on GeSe crystal is fabricated and its temporal photoresponse is studied under 670 nm Light of power intensity 3 mW/cm<sup>2</sup> and white Light of different intensities. The detector showed a fast response with a response time 0.1 s. The photocurrent 30.222 µA is achieved under 670 nm Light. In addition, the enhanced photoresponsivity of 105.79 mA W<sup>−1</sup> and specific detectivity of 4.80 × 10<sup>10</sup> Jones are also achieved under 670 nm laser illumination with 3 mW/cm<sup>2</sup>.</p></div>\",\"PeriodicalId\":473,\"journal\":{\"name\":\"Applied Physics A\",\"volume\":\"131 10\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics A\",\"FirstCategoryId\":\"4\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s00339-025-08915-y\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics A","FirstCategoryId":"4","ListUrlMain":"https://link.springer.com/article/10.1007/s00339-025-08915-y","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

IV-VI族过渡金属硫族化合物(TMC)片层半导体由于其可调谐的特性而引起了研究人员的广泛关注。在这里,作者展示了使用直接蒸汽输运(DVT)技术生长GeSe单晶。用粉末x射线衍射(PXRD)研究了生长晶体的结构特性。晶体的透射电镜分析表明,生长材料为单晶材料。采用紫外-可见-近红外(UV-VIS-NIR)光谱法研究了GeSe晶体的带隙。用拉曼光谱研究了GeSe的振动模式。制作了基于GeSe晶体的光电探测器,研究了其在功率强度为3 mW/cm2的670 nm光和不同强度白光下的时间光响应。该检测器的响应速度快,响应时间为0.1 s。在670 nm光下,光电流达到30.222µA。此外,在3mw /cm2的670 nm激光照射下,光响应度达到105.79 mA W−1,比探测率达到4.80 × 1010 Jones。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Exploring the photodetection properties of layered GeSe single-crystal

Exploring the photodetection properties of layered GeSe single-crystal

The lamellar Transition metal chalcogenides (TMC) semiconductors from IV-VI group have attracted researchers due to their tunable properties. Here, the author demonstrated the growth of GeSe single crystals using direct vapour transport (DVT) technique. The structural property of grown crystals is studied by powder X-ray diffraction (PXRD). The transmission electron microscopy (TEM) of the grown crystal revealed that the grown material is single-crystalline. UV-Visible-NIR (UV-VIS-NIR) spectroscopy is carried out to study the band gap of GeSe crystal. The vibrational modes of GeSe are studied by RAMAN spectroscopy. The photodetector based on GeSe crystal is fabricated and its temporal photoresponse is studied under 670 nm Light of power intensity 3 mW/cm2 and white Light of different intensities. The detector showed a fast response with a response time 0.1 s. The photocurrent 30.222 µA is achieved under 670 nm Light. In addition, the enhanced photoresponsivity of 105.79 mA W−1 and specific detectivity of 4.80 × 1010 Jones are also achieved under 670 nm laser illumination with 3 mW/cm2.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Applied Physics A
Applied Physics A 工程技术-材料科学:综合
CiteScore
4.80
自引率
7.40%
发文量
964
审稿时长
38 days
期刊介绍: Applied Physics A publishes experimental and theoretical investigations in applied physics as regular articles, rapid communications, and invited papers. The distinguished 30-member Board of Editors reflects the interdisciplinary approach of the journal and ensures the highest quality of peer review.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信