{"title":"基于电荷阱的三维NAND闪存程序(PGM)运行的半解析物理瞬态模型","authors":"Jinil Yoo, Haechan Choi, Hyungcheol Shin","doi":"10.1007/s10825-025-02385-4","DOIUrl":null,"url":null,"abstract":"<div><p>In this paper, we propose a new program (PGM) transient model for three-dimensional (3-D) gate-all-around (GAA) cylindrical NAND flash memory. An emission term is added to previous models and is combined into a compact form with distinct acceptor/donor-like trap levels. The continuity equation is solved, including Shockley–Read–Hall (SRH) recombination theory to track the concentration of the conduction band (CB) free electrons. The threshold voltage transient is obtained from the electron/hole concentrations, and single/incremental step pulse programming (ISPP) pulse experimental data are calibrated with the model to check its validity.</p></div>","PeriodicalId":620,"journal":{"name":"Journal of Computational Electronics","volume":"24 5","pages":""},"PeriodicalIF":2.5000,"publicationDate":"2025-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10825-025-02385-4.pdf","citationCount":"0","resultStr":"{\"title\":\"A semi-analytical physics-based transient model for program (PGM) operation of charge-trap-based 3-D NAND flash memories\",\"authors\":\"Jinil Yoo, Haechan Choi, Hyungcheol Shin\",\"doi\":\"10.1007/s10825-025-02385-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>In this paper, we propose a new program (PGM) transient model for three-dimensional (3-D) gate-all-around (GAA) cylindrical NAND flash memory. An emission term is added to previous models and is combined into a compact form with distinct acceptor/donor-like trap levels. The continuity equation is solved, including Shockley–Read–Hall (SRH) recombination theory to track the concentration of the conduction band (CB) free electrons. The threshold voltage transient is obtained from the electron/hole concentrations, and single/incremental step pulse programming (ISPP) pulse experimental data are calibrated with the model to check its validity.</p></div>\",\"PeriodicalId\":620,\"journal\":{\"name\":\"Journal of Computational Electronics\",\"volume\":\"24 5\",\"pages\":\"\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2025-07-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://link.springer.com/content/pdf/10.1007/s10825-025-02385-4.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Computational Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10825-025-02385-4\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Computational Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10825-025-02385-4","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A semi-analytical physics-based transient model for program (PGM) operation of charge-trap-based 3-D NAND flash memories
In this paper, we propose a new program (PGM) transient model for three-dimensional (3-D) gate-all-around (GAA) cylindrical NAND flash memory. An emission term is added to previous models and is combined into a compact form with distinct acceptor/donor-like trap levels. The continuity equation is solved, including Shockley–Read–Hall (SRH) recombination theory to track the concentration of the conduction band (CB) free electrons. The threshold voltage transient is obtained from the electron/hole concentrations, and single/incremental step pulse programming (ISPP) pulse experimental data are calibrated with the model to check its validity.
期刊介绍:
he Journal of Computational Electronics brings together research on all aspects of modeling and simulation of modern electronics. This includes optical, electronic, mechanical, and quantum mechanical aspects, as well as research on the underlying mathematical algorithms and computational details. The related areas of energy conversion/storage and of molecular and biological systems, in which the thrust is on the charge transport, electronic, mechanical, and optical properties, are also covered.
In particular, we encourage manuscripts dealing with device simulation; with optical and optoelectronic systems and photonics; with energy storage (e.g. batteries, fuel cells) and harvesting (e.g. photovoltaic), with simulation of circuits, VLSI layout, logic and architecture (based on, for example, CMOS devices, quantum-cellular automata, QBITs, or single-electron transistors); with electromagnetic simulations (such as microwave electronics and components); or with molecular and biological systems. However, in all these cases, the submitted manuscripts should explicitly address the electronic properties of the relevant systems, materials, or devices and/or present novel contributions to the physical models, computational strategies, or numerical algorithms.