面向未来人工智能和物联网应用的D触发器性能和可靠性问题综述

IF 1.2 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Syeda Hurmath Juveria, R. Shashank, J. Ajayan, Amit Krishna Dwivedi, D. Nirmal
{"title":"面向未来人工智能和物联网应用的D触发器性能和可靠性问题综述","authors":"Syeda Hurmath Juveria,&nbsp;R. Shashank,&nbsp;J. Ajayan,&nbsp;Amit Krishna Dwivedi,&nbsp;D. Nirmal","doi":"10.1049/cds2/7132642","DOIUrl":null,"url":null,"abstract":"<p>In this paper, various D flip-flops (FFs) (DFFs) are studied and analyzed based on the performance and reliability effects of different architectures, technology, area, power, delay, and several other key performance parameters of DFFs. Based on these parameters, a few selected DFFs such as C2SFF, conditional-bridging FF (CBFF)-S, self-shut-off pulsed latch (SSPL), retentive true signal phased clock (R-TSPC), mTGFF, mC2MOS, FS-TSPC-DET-FF, and P-FF, are briefly reviewed for different architectures and technologies, with the trade-off between the various performance parameters discussed in this paper. Comparative analysis is done for the selected DFFs on technology, supply voltage, set-up time, delay, power consumption, and area. Reliability effects on DFFs and aging effect on FFs are reviewed for timing yield-aware lifetime reliability (TYR) based on the process variations (PVs) and bias temperature instability (BTI). A brief review on applications of DFFs in internet of thing (IoT) devices and artificial intelligence (AI), such as frequency divider, dual-modulus prescaler, time-to-digital converter (TDC), shifter, and synchronizer, is also presented.</p>","PeriodicalId":50386,"journal":{"name":"Iet Circuits Devices & Systems","volume":"2025 1","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2025-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/cds2/7132642","citationCount":"0","resultStr":"{\"title\":\"A Review of Performance and Reliability Issues in D Flip-Flops for Future Artificial Intelligence and Internet of Things Applications\",\"authors\":\"Syeda Hurmath Juveria,&nbsp;R. Shashank,&nbsp;J. Ajayan,&nbsp;Amit Krishna Dwivedi,&nbsp;D. Nirmal\",\"doi\":\"10.1049/cds2/7132642\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>In this paper, various D flip-flops (FFs) (DFFs) are studied and analyzed based on the performance and reliability effects of different architectures, technology, area, power, delay, and several other key performance parameters of DFFs. Based on these parameters, a few selected DFFs such as C2SFF, conditional-bridging FF (CBFF)-S, self-shut-off pulsed latch (SSPL), retentive true signal phased clock (R-TSPC), mTGFF, mC2MOS, FS-TSPC-DET-FF, and P-FF, are briefly reviewed for different architectures and technologies, with the trade-off between the various performance parameters discussed in this paper. Comparative analysis is done for the selected DFFs on technology, supply voltage, set-up time, delay, power consumption, and area. Reliability effects on DFFs and aging effect on FFs are reviewed for timing yield-aware lifetime reliability (TYR) based on the process variations (PVs) and bias temperature instability (BTI). A brief review on applications of DFFs in internet of thing (IoT) devices and artificial intelligence (AI), such as frequency divider, dual-modulus prescaler, time-to-digital converter (TDC), shifter, and synchronizer, is also presented.</p>\",\"PeriodicalId\":50386,\"journal\":{\"name\":\"Iet Circuits Devices & Systems\",\"volume\":\"2025 1\",\"pages\":\"\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2025-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/cds2/7132642\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iet Circuits Devices & Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/cds2/7132642\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iet Circuits Devices & Systems","FirstCategoryId":"5","ListUrlMain":"https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/cds2/7132642","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

本文对各种D触发器(dff)进行了研究和分析,分析了dff的不同架构、技术、面积、功耗、延迟等几个关键性能参数对性能和可靠性的影响。基于这些参数,本文简要介绍了几种dff,如C2SFF、条件桥接FF (CBFF)-S、自关断脉冲锁存器(SSPL)、保留真信号相控时钟(R-TSPC)、mTGFF、mC2MOS、fs - tspc - dt -FF和P-FF,并讨论了各种性能参数之间的权衡。对所选dff在技术、电源电压、设置时间、延时、功耗和面积等方面进行了比较分析。在基于工艺变化(pv)和偏置温度不稳定性(BTI)的产量感知寿命可靠性(TYR)中,综述了dff的可靠性效应和老化效应。简要介绍了dff在物联网(IoT)设备和人工智能(AI)中的应用,如分频器、双模预分频器、时间-数字转换器(TDC)、移位器和同步器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

A Review of Performance and Reliability Issues in D Flip-Flops for Future Artificial Intelligence and Internet of Things Applications

A Review of Performance and Reliability Issues in D Flip-Flops for Future Artificial Intelligence and Internet of Things Applications

In this paper, various D flip-flops (FFs) (DFFs) are studied and analyzed based on the performance and reliability effects of different architectures, technology, area, power, delay, and several other key performance parameters of DFFs. Based on these parameters, a few selected DFFs such as C2SFF, conditional-bridging FF (CBFF)-S, self-shut-off pulsed latch (SSPL), retentive true signal phased clock (R-TSPC), mTGFF, mC2MOS, FS-TSPC-DET-FF, and P-FF, are briefly reviewed for different architectures and technologies, with the trade-off between the various performance parameters discussed in this paper. Comparative analysis is done for the selected DFFs on technology, supply voltage, set-up time, delay, power consumption, and area. Reliability effects on DFFs and aging effect on FFs are reviewed for timing yield-aware lifetime reliability (TYR) based on the process variations (PVs) and bias temperature instability (BTI). A brief review on applications of DFFs in internet of thing (IoT) devices and artificial intelligence (AI), such as frequency divider, dual-modulus prescaler, time-to-digital converter (TDC), shifter, and synchronizer, is also presented.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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