以机器学习为方向的单晶硅KOH刻蚀的广义精确方法

IF 3.3 3区 材料科学 Q3 CHEMISTRY, PHYSICAL
Silicon Pub Date : 2025-05-30 DOI:10.1007/s12633-025-03350-3
Lawrence Daniel Stephen Tamil, Jeffrey Joseph John Jeya Kamaraj, Senthil Pandian Muthu, Ramasamy Perumalsamy
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引用次数: 0

摘要

这项工作是关于使用多项式回归机器学习模型预测蚀刻时间,以消除锯损伤并达到所需的单晶硅片厚度。使用金刚石线锯切割了100多片晶圆片。所有晶片均在KOH溶液中蚀刻。记录初始和最终厚度以训练ML模型。为精确求得最终厚度,建立了计算方程。使用数学计算减少了特征的数量。将简化后的特征和输出输入到多项式回归算法中,得到训练好的模型。训练好的模型被导出到一个pickle文件中。通过计算验证了KOH的含量。利用训练好的模型和计算结果,利用Python自带的图形用户界面tkinter开发了用户友好的界面软件。图形用户界面获得7个参数作为输入。它们是长度,宽度,厚度,晶圆片的期望厚度,温度,KOH的量和水。利用所有输入,可以精确地计算出反应的蚀刻时间。计算器的主要受益者是实验室寻求实现精确和特定的目标晶圆厚度。该工具对于寻找新的晶圆尺寸和旨在消除锯伤的行业尤其有利。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Generalized Precise Approach for KOH Etching in Monocrystalline Silicon Wafer with an Orientation of < 100 > using Machine Learning

This work is about predicting the etching time to remove the saw damage and achieve the desired thickness of the monocrystalline silicon wafer using a polynomial regression machine learning model. More than 100 wafers were sliced using a diamond wire saw. All the wafers were etched in KOH solution. The initial and final thicknesses were logged to train the ML model. The equations were formulated to attain the final thickness precisely. The number of features was reduced using mathematical calculations. The reduced features and outputs were fed into a polynomial regression algorithm to get a trained model. The trained model was exported into a pickle file. The calculations were made to validate the quantity of KOH. Using the trained model and the calculations, the user-friendly interfacing software was developed with tkinter, an own graphical user interface of Python. The graphical user interface gets 7 parameters as inputs. They are Length, breadth, thickness, desired thickness of the wafer, temperature, quantity of KOH, and water. Using all the inputs, it can precisely calculate the etching time of the reaction. The primary beneficiaries of the calculator are laboratories seeking to achieve precise and specific target wafer thickness. The tool is particularly advantageous for industries looking for new wafer dimensions and for those aiming to remove saw damage.

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来源期刊
Silicon
Silicon CHEMISTRY, PHYSICAL-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.90
自引率
20.60%
发文量
685
审稿时长
>12 weeks
期刊介绍: The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.
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