Lawrence Daniel Stephen Tamil, Jeffrey Joseph John Jeya Kamaraj, Senthil Pandian Muthu, Ramasamy Perumalsamy
{"title":"以机器学习为方向的单晶硅KOH刻蚀的广义精确方法","authors":"Lawrence Daniel Stephen Tamil, Jeffrey Joseph John Jeya Kamaraj, Senthil Pandian Muthu, Ramasamy Perumalsamy","doi":"10.1007/s12633-025-03350-3","DOIUrl":null,"url":null,"abstract":"<div><p>This work is about predicting the etching time to remove the saw damage and achieve the desired thickness of the monocrystalline silicon wafer using a polynomial regression machine learning model. More than 100 wafers were sliced using a diamond wire saw. All the wafers were etched in KOH solution. The initial and final thicknesses were logged to train the ML model. The equations were formulated to attain the final thickness precisely. The number of features was reduced using mathematical calculations. The reduced features and outputs were fed into a polynomial regression algorithm to get a trained model. The trained model was exported into a pickle file. The calculations were made to validate the quantity of KOH. Using the trained model and the calculations, the user-friendly interfacing software was developed with tkinter, an own graphical user interface of Python. The graphical user interface gets 7 parameters as inputs. They are Length, breadth, thickness, desired thickness of the wafer, temperature, quantity of KOH, and water. Using all the inputs, it can precisely calculate the etching time of the reaction. The primary beneficiaries of the calculator are laboratories seeking to achieve precise and specific target wafer thickness. The tool is particularly advantageous for industries looking for new wafer dimensions and for those aiming to remove saw damage.</p></div>","PeriodicalId":776,"journal":{"name":"Silicon","volume":"17 10","pages":"2393 - 2406"},"PeriodicalIF":3.3000,"publicationDate":"2025-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Generalized Precise Approach for KOH Etching in Monocrystalline Silicon Wafer with an Orientation of < 100 > using Machine Learning\",\"authors\":\"Lawrence Daniel Stephen Tamil, Jeffrey Joseph John Jeya Kamaraj, Senthil Pandian Muthu, Ramasamy Perumalsamy\",\"doi\":\"10.1007/s12633-025-03350-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>This work is about predicting the etching time to remove the saw damage and achieve the desired thickness of the monocrystalline silicon wafer using a polynomial regression machine learning model. More than 100 wafers were sliced using a diamond wire saw. All the wafers were etched in KOH solution. The initial and final thicknesses were logged to train the ML model. The equations were formulated to attain the final thickness precisely. The number of features was reduced using mathematical calculations. The reduced features and outputs were fed into a polynomial regression algorithm to get a trained model. The trained model was exported into a pickle file. The calculations were made to validate the quantity of KOH. Using the trained model and the calculations, the user-friendly interfacing software was developed with tkinter, an own graphical user interface of Python. The graphical user interface gets 7 parameters as inputs. They are Length, breadth, thickness, desired thickness of the wafer, temperature, quantity of KOH, and water. Using all the inputs, it can precisely calculate the etching time of the reaction. The primary beneficiaries of the calculator are laboratories seeking to achieve precise and specific target wafer thickness. The tool is particularly advantageous for industries looking for new wafer dimensions and for those aiming to remove saw damage.</p></div>\",\"PeriodicalId\":776,\"journal\":{\"name\":\"Silicon\",\"volume\":\"17 10\",\"pages\":\"2393 - 2406\"},\"PeriodicalIF\":3.3000,\"publicationDate\":\"2025-05-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Silicon\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s12633-025-03350-3\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Silicon","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s12633-025-03350-3","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
A Generalized Precise Approach for KOH Etching in Monocrystalline Silicon Wafer with an Orientation of < 100 > using Machine Learning
This work is about predicting the etching time to remove the saw damage and achieve the desired thickness of the monocrystalline silicon wafer using a polynomial regression machine learning model. More than 100 wafers were sliced using a diamond wire saw. All the wafers were etched in KOH solution. The initial and final thicknesses were logged to train the ML model. The equations were formulated to attain the final thickness precisely. The number of features was reduced using mathematical calculations. The reduced features and outputs were fed into a polynomial regression algorithm to get a trained model. The trained model was exported into a pickle file. The calculations were made to validate the quantity of KOH. Using the trained model and the calculations, the user-friendly interfacing software was developed with tkinter, an own graphical user interface of Python. The graphical user interface gets 7 parameters as inputs. They are Length, breadth, thickness, desired thickness of the wafer, temperature, quantity of KOH, and water. Using all the inputs, it can precisely calculate the etching time of the reaction. The primary beneficiaries of the calculator are laboratories seeking to achieve precise and specific target wafer thickness. The tool is particularly advantageous for industries looking for new wafer dimensions and for those aiming to remove saw damage.
期刊介绍:
The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.