浓度过冷对GaInAsSbP/GaP异质结构和性能的影响

IF 0.4 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-06-25 DOI:10.1134/S1027451025700041

L. S. Lunin, M. L. Lunina, A. S. Pashchenko, A. V. Donskaya

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引用次数: 0

摘要

研究了浓度过冷对温度梯度区再结晶法生长的GaInAsSbP/GaP异质结构的影响。揭示了生长过程的主要工艺参数，并确定了溶液熔体的初始浓度过冷值，这是建立防止基体热降解和消除捕获溶液熔体微包裹体可能性的结晶制度所必需的。发现了GaP衬底和GaInAsSbP层晶格参数的不匹配与初始过冷的关系。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Effect of Concentration Supercooling on the Structure and Properties of GaInAsSbP/GaP Heterostructures

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Effect of Concentration Supercooling on the Structure and Properties of GaInAsSbP/GaP Heterostructures

The effect of concentration supercooling on the structure of GaInAsSbP/GaP heterostructures grown by the method of zone recrystallization by a temperature gradient is investigated. The main technological parameters of the growth process are revealed, and the value of the initial concentration supercooling of the solution–melt is determined, which is necessary to establish a crystallization regime that prevents thermal degradation of the substrate and eliminates the possibility of capturing microinclusions of the solution–melt. The dependence of the mismatch of the lattice parameters of the GaP substrate and the GaInAsSbP layer on the initial supercooling is found.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.