A. V. Arzhannikov, S. L. Sinitsky, D. A. Samtsov, P. V. Kalinin, S. A. Kuznetsov, V. D. Stepanov, S. S. Popov, E. S. Sandalov, M. G. Atlukhanov, A. V. Stankevich, A. V. Pestov, N. A. Nikolaev, A. A. Rybak
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Relative changes in the real part of the permittivity of individual polyvinylidene fluoride samples were found to reach a level of 0.5 with an initial value of about 3.0, while for polyvinyl chloride samples, no changes in this parameter were registered. At the same time, for individual polyurea samples, both significant and negligible changes in this parameter were observed as a result of the exposure. The results of the experiments provide a basis for using thin-film polymer materials as substrates for supramolecular complex samples, which during research will be exposed to powerful pulsed radiation fluxes in the submillimeter wavelength range.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 1","pages":"115 - 121"},"PeriodicalIF":0.4000,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Changes in the Spectral Characteristics of Some Polymeric Materials in the Frequency Range from 0.2 to 2 THz as a Result of Exposure to a Megawatt Flux of Submillimeter Radiation of Microsecond Duration\",\"authors\":\"A. V. Arzhannikov, S. L. Sinitsky, D. A. Samtsov, P. V. Kalinin, S. A. Kuznetsov, V. D. Stepanov, S. S. Popov, E. S. Sandalov, M. G. Atlukhanov, A. V. Stankevich, A. V. 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引用次数: 0
摘要
研究了脉冲毫瓦亚毫米(0.1-0.4太赫兹)辐射通量对某些聚合物薄膜材料在0.2 - 2太赫兹频率范围内的光谱特性的影响。在时域光谱和BWO光谱框架内对聚合物样品进行了技术表征。实验采用了golg - pet装置(Budker Institute of Nuclear Physics SB RAS)束流-等离子体相互作用过程中产生的亚毫米波长范围内持续时间约为4 μs的辐射通量。单个聚偏氟乙烯样品的介电常数实部的相对变化达到了0.5的水平,初始值约为3.0,而聚氯乙烯样品的介电常数实部没有变化。同时,对于单个聚脲样品,该参数的变化既显著又可忽略不计,这是暴露的结果。实验结果为利用薄膜聚合物材料作为衬底制备超分子复合物样品提供了基础,该样品在研究过程中将暴露在亚毫米波波长范围内的强脉冲辐射中。
Changes in the Spectral Characteristics of Some Polymeric Materials in the Frequency Range from 0.2 to 2 THz as a Result of Exposure to a Megawatt Flux of Submillimeter Radiation of Microsecond Duration
The effect of exposure to pulsed megawatt submillimeter (0.1–0.4 THz) radiation fluxes on the spectral characteristics of some thin-film polymer materials in the frequency range from 0.2 to 2 THz has been registered. The polymer samples were characterized using technical solutions within the framework of time-domain spectroscopy and BWO spectroscopy. For the exposure, a radiation flux in the submillimeter wavelength range with a duration of about 4 μs, generated during beam–plasma interaction at the GOL–PET facility (Budker Institute of Nuclear Physics SB RAS), was used. Relative changes in the real part of the permittivity of individual polyvinylidene fluoride samples were found to reach a level of 0.5 with an initial value of about 3.0, while for polyvinyl chloride samples, no changes in this parameter were registered. At the same time, for individual polyurea samples, both significant and negligible changes in this parameter were observed as a result of the exposure. The results of the experiments provide a basis for using thin-film polymer materials as substrates for supramolecular complex samples, which during research will be exposed to powerful pulsed radiation fluxes in the submillimeter wavelength range.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.