基于最优性能算法的极紫外扫描仪中板块运动控制

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
E. V. Petrakov, D. V. Balandin
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引用次数: 0

摘要

本文讨论了用最优性能算法控制极紫外扫描仪中光刻版的运动。该主题的相关性是由于半导体行业对硅衬底暴露期间的定位精度提出了新的要求。讨论了由磁致伸缩驱动器引起的颤振和不必要的振荡引起的问题。提出了一种基于庞特里亚金极大值原理和滑模控制方法的振动阻尼方法。研究了各种控制函数,包括sgn函数和双曲正切函数,以最大限度地减少颤振对机械系统的负面影响。仿真结果表明,平滑控制函数的使用有效地抑制了振荡,提高了定位精度,这对于复杂集成电路的制造至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Control of the Plate Movement in Extreme Ultraviolet Scanners Based on Optimal Performance Algorithms

Control of the Plate Movement in Extreme Ultraviolet Scanners Based on Optimal Performance Algorithms

This article discusses the control of the lithographic plate movement in extreme ultraviolet scanners using optimal performance algorithms. The relevance of the topic is due to the new requirements of the semiconductor industry for positioning accuracy during the exposure of silicon substrates. Issues arising from chatter, unwanted oscillations caused by magnetostrictive drives, are addressed. An approach based on Pontryagin’s maximum principle and sliding mode control methods is proposed for damping oscillations. Various control functions, including the signum function and hyperbolic tangent, are investigated to minimize the negative impact of chatter on the mechanical system. Simulation results show that the use of smooth control functions effectively suppresses oscillations and increases positioning accuracy, which is critical for the fabrication of complex integrated circuits.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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