紧凑中子源旋转水冷靶

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
P. V. Shvets, P. A. Prokopovich, E. I. Fatyanov, S. F. Sidorkin, A. Yu. Goihman
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引用次数: 0

摘要

紧凑中子源,包括那些基于质子束轰击铍的中子源(例如,DARIA项目),假设使用高热负荷(~10千瓦)的目标。为了分散这种热量,我们之前开发了一个旋转水冷靶的概念。每个质子脉冲击中一个新的铍板,使加热功率分布在一个大的区域,并从系统中获得良好的热量排出。然而,冷却并不理想:需要高水流量,导致铍段附近的巨大压力,并在设备运行期间造成铍段破坏的威胁。在这里,我们考虑了一个新的和更有效的水冷却概念,表明水正常地流向冷却表面(射流冷却)。热力学数值模拟使我们能够根据冷却水流量估计靶材的最高温度和铍段附近的水压。与旧的目标组装概念相比,我们展示了该设备的所有参数的显着改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Rotating Water-Jet-Cooled Target for Compact Neutron Source

Rotating Water-Jet-Cooled Target for Compact Neutron Source

Compact neutron sources, including those based on bombardment of beryllium by a proton beam (e.g., DARIA project), assume using of targets with high thermal loading (~10 kW). To dissipate this heating power, we previously developed a concept of a rotating water-cooled target. Each proton pulse hit a new beryllium plate allowing distributing heating power over a large area and achieving good heat removal from the system. However, the cooling was not ideal: high water flow was required, leading to significant pressures near beryllium segments and creating a threat of their destruction during the operation of the device. Here, we consider a new and more efficient concept of water cooling suggesting that water flows normally to the cooled surfaces (jet cooling). Thermodynamic numerical simulations allowed us to estimate the maximum temperature of targets and water pressure near beryllium segments depending on the cooling water flow. We showed a significant improvement of all parameters of the device compared to the old concept of target assembly.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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