用于未来电子学的二维氧化硒化铋半导体

Congwei Tan, Junchuan Tang, Xin Gao, Chengyuan Xue, Hailin Peng
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引用次数: 0

摘要

硅晶体管的不断缩小推动了计算性能和能源效率的指数级提高,但10纳米以下的通道长度在速度和功耗方面构成了根本性的挑战。新兴材料和结构为进一步小型化提供了有希望的途径。氧硒化铋(Bi2O2Se)是一种空气稳定的二维半导体,具有高迁移率、合适的带隙和天然的高κ氧化物(Bi2SeO5),类似于硅和其对应的SiO2。这些特性表明与工业过程的兼容性,使Bi2O2Se定位于下一代高性能计算。本文总结了材料合成、晶圆级集成和器件架构方面的最新进展,强调了从实验室到晶圆厂过渡的关键挑战。最后,提出了一个路线图,以指导未来的超大规模,节能电子产品的创新。本综述探讨了Bi2O2Se作为下一代计算的有前途的2D半导体,突出其高迁移率,合适的带隙和天然高κ氧化物,可实现晶圆级集成和与工业过程的兼容性,同时解决了从实验室到晶圆厂过渡的关键挑战,并提出了超大规模,节能电子产品的路线图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

2D bismuth oxyselenide semiconductor for future electronics

2D bismuth oxyselenide semiconductor for future electronics
The continuous downscaling of silicon transistors has driven exponential improvements in computing performance and energy efficiency, but sub-10 nm channel lengths pose fundamental challenges in speed and power consumption. Emerging materials and architectures offer promising pathways for further miniaturization. Bismuth oxyselenide (Bi2O2Se), an air-stable 2D semiconductor, exhibits high mobility, a suitable bandgap and a native high-κ oxide (Bi2SeO5), resembling silicon and its SiO2 counterpart. These properties suggest compatibility with industrial processes, positioning Bi2O2Se for next-generation high-performance computing. This Review summarizes recent advances in material synthesis, wafer-scale integration and device architectures, highlighting key challenges in the lab-to-fab transition. Finally, a roadmap is proposed to guide future innovations in ultra-scaled, energy-efficient electronics. This Review explores Bi2O2Se as a promising 2D semiconductor for next-generation computing, highlighting its high mobility, suitable bandgap and native high-κ oxide, which enables wafer-scale integration and compatibility with industrial processes, while addressing key challenges in the lab-to-fab transition and proposing a roadmap for ultra-scaled, energy-efficient electronics.
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