{"title":"利用串并联金纳米隙和电迁移库仑岛计算储层","authors":"Keita Sakai, , , Yudai Tanaka, , , Mamiko Yagi, , , Mitsuki Ito, , and , Jun-ichi Shirakashi*, ","doi":"10.1021/acsaelm.5c01068","DOIUrl":null,"url":null,"abstract":"<p >Reservoir computing necessitates the development of devices exhibiting complex dynamic characteristics to enable efficient hardware implementation. This study introduces a physical reservoir computing (PRC) scheme based on series-parallel-connected Au nanogaps activated through a specialized technique. The method utilizes electromigration, driven by field emission currents across the nanogaps, to modulate the tunnel resistance. The memory capacities of physical reservoirs configured as 2 × 1 and 3 × 2 series-parallel-connected nanogaps were experimentally evaluated by using short-term memory (STM) and parity check (PC) tasks. Unlike single-nanogap systems, these series-parallel configurations do not exhibit a reservoir property region characterized by high STM capacity and low PC capacity. Instead, they demonstrate enhanced memory performance in both STM and PC tasks. Compared with systems based on single Au nanogaps, these configurations significantly improve STM and PC capabilities without increasing the number of virtual nodes, thereby preserving the processing speed inherent to single-nanogap systems. Furthermore, scanning electron microscopy revealed structural modifications within the nanogaps after reservoir operation, including the formation of single-electron transistor islands, which may enhance computational capabilities through single-electron tunneling effects. Evidence of Coulomb blockade behavior, observed as a distinct suppression of conductance near zero bias voltage in the drain current–drain voltage characteristics, further supports this enhancement. These results establish series-parallel-connected Au nanogaps as efficient physical reservoirs and present a promising approach for advancing PRC systems based on Au nanogaps subjected to this activation technique.</p>","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"7 18","pages":"8400–8408"},"PeriodicalIF":4.7000,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reservoir Computing Using Series-Parallel-Connected Au Nanogaps and Electromigrated Coulomb Islands\",\"authors\":\"Keita Sakai, , , Yudai Tanaka, , , Mamiko Yagi, , , Mitsuki Ito, , and , Jun-ichi Shirakashi*, \",\"doi\":\"10.1021/acsaelm.5c01068\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >Reservoir computing necessitates the development of devices exhibiting complex dynamic characteristics to enable efficient hardware implementation. This study introduces a physical reservoir computing (PRC) scheme based on series-parallel-connected Au nanogaps activated through a specialized technique. The method utilizes electromigration, driven by field emission currents across the nanogaps, to modulate the tunnel resistance. The memory capacities of physical reservoirs configured as 2 × 1 and 3 × 2 series-parallel-connected nanogaps were experimentally evaluated by using short-term memory (STM) and parity check (PC) tasks. Unlike single-nanogap systems, these series-parallel configurations do not exhibit a reservoir property region characterized by high STM capacity and low PC capacity. Instead, they demonstrate enhanced memory performance in both STM and PC tasks. Compared with systems based on single Au nanogaps, these configurations significantly improve STM and PC capabilities without increasing the number of virtual nodes, thereby preserving the processing speed inherent to single-nanogap systems. Furthermore, scanning electron microscopy revealed structural modifications within the nanogaps after reservoir operation, including the formation of single-electron transistor islands, which may enhance computational capabilities through single-electron tunneling effects. Evidence of Coulomb blockade behavior, observed as a distinct suppression of conductance near zero bias voltage in the drain current–drain voltage characteristics, further supports this enhancement. These results establish series-parallel-connected Au nanogaps as efficient physical reservoirs and present a promising approach for advancing PRC systems based on Au nanogaps subjected to this activation technique.</p>\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"7 18\",\"pages\":\"8400–8408\"},\"PeriodicalIF\":4.7000,\"publicationDate\":\"2025-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acsaelm.5c01068\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acsaelm.5c01068","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Reservoir Computing Using Series-Parallel-Connected Au Nanogaps and Electromigrated Coulomb Islands
Reservoir computing necessitates the development of devices exhibiting complex dynamic characteristics to enable efficient hardware implementation. This study introduces a physical reservoir computing (PRC) scheme based on series-parallel-connected Au nanogaps activated through a specialized technique. The method utilizes electromigration, driven by field emission currents across the nanogaps, to modulate the tunnel resistance. The memory capacities of physical reservoirs configured as 2 × 1 and 3 × 2 series-parallel-connected nanogaps were experimentally evaluated by using short-term memory (STM) and parity check (PC) tasks. Unlike single-nanogap systems, these series-parallel configurations do not exhibit a reservoir property region characterized by high STM capacity and low PC capacity. Instead, they demonstrate enhanced memory performance in both STM and PC tasks. Compared with systems based on single Au nanogaps, these configurations significantly improve STM and PC capabilities without increasing the number of virtual nodes, thereby preserving the processing speed inherent to single-nanogap systems. Furthermore, scanning electron microscopy revealed structural modifications within the nanogaps after reservoir operation, including the formation of single-electron transistor islands, which may enhance computational capabilities through single-electron tunneling effects. Evidence of Coulomb blockade behavior, observed as a distinct suppression of conductance near zero bias voltage in the drain current–drain voltage characteristics, further supports this enhancement. These results establish series-parallel-connected Au nanogaps as efficient physical reservoirs and present a promising approach for advancing PRC systems based on Au nanogaps subjected to this activation technique.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico