Daniil O. Samsonov , Nikita S. Klochkov , Sergey V. Goncharov , Abdulkarim A. Amirov , Aleksei S. Komlev
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A novel method for local undulator period measurement via magnetic domain wall motion detection
Traditional scanning methods for magnetic measurements are limited in spatial resolution and sensitivity to magnetic field inhomogeneities, which reduces their effectiveness in high-precision measurements. We proposed the method, which enables precise localization of regions where the transverse component of magnetic induction becomes zero in the undulator gap. A new method based on the detection of the displacement of a domain wall in a ferromagnetic plate. Determining regions with near zero field value is critical for evaluating the undulator period length and detecting inhomogeneities that influence radiation spectral characteristics. A theoretical sensitivity analysis of the method was performed, followed by experimental validation on a model undulator with NdFeB magnets arranged in a Halbach configuration. The results were compared with conventional Hall probe measurements, demonstrating the method’s effectiveness. Additionally, we discuss potential advancements, such as employing ferromagnetic materials with high domain wall mobility to further enhance performance.
期刊介绍:
Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas:
• Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results.
• Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon.
• Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays.
• Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers.
Etc...