级联隧道磁阻传感器正弦特性线性化电子系统设计

IF 2.5 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Ritu Ranjan, Sanjoy Mandal
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引用次数: 0

摘要

为实现对转轴的有效监控,设计并实现了角度跟踪系统。一个关键的焦点是最大限度地减少系统的非线性。本设计集成了级联磁阻传感器,输出对应于动轴旋转的模拟正弦和余弦信号。这些信号通过电压-频率(V/F)转换器转换成频率输出,从而实现强大的数字处理。为了提高系统的线性度,采用了三种线性化技术,并进行了对比分析。仿真和实验评估证实,采用线性化方案- c,系统具有良好的线性度。该方案在理想情况和实际情况下的非线性百分比分别为0.00335%和0.1143%,而在理想情况和实际情况下的百分比误差分别为0.00334%和0.1143%。由此产生的系统设计紧凑,具有成本效益,适用于一系列工业自动化和机器人应用,其中精确的角度反馈是必不可少的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design of electronic system for linearization of sinusoidal characteristics of cascaded tunneling magneto-resistance sensor
This paper presents the design and implementation of angle tracking system for efficient monitoring of rotating shaft. A key focus is minimizing system non-linearity to the maximum extent. This design integrates a cascaded magneto-resistance sensor that outputs analog sine and cosine signals corresponding to the rotation of moving shaft. These signals are converted into frequency outputs using a voltage-to-frequency (V/F) converter, allowing for robust digital processing. Three linearization techniques are applied and comparatively analyzed to improve system linearity. Simulation and experimental evaluations confirm that the system delivers excellent linearity with the linearizing scheme-C. The obtained percentage non-linearity in this scheme for ideal and practical case are 0.00335%, 0.1143% respectively whereas the percentage error is 0.00334% in ideal case and 0.1143% in practical situation. The resulting system design is compact, cost-effective, and suitable for a range of industrial automation and robotics applications where precise angular feedback is essential.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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