N. Baghban-Bousari , D. Eric , G. Palau , A. Crespo-Yepes , M. Porti , E. Ramon , S. Ogier , M. Nafria
{"title":"安全微电子用预应力有机薄膜晶体管物理不可克隆功能的可行性","authors":"N. Baghban-Bousari , D. Eric , G. Palau , A. Crespo-Yepes , M. Porti , E. Ramon , S. Ogier , M. Nafria","doi":"10.1016/j.mee.2025.112407","DOIUrl":null,"url":null,"abstract":"<div><div>Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (I<sub>D</sub>) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.</div></div>","PeriodicalId":18557,"journal":{"name":"Microelectronic Engineering","volume":"302 ","pages":"Article 112407"},"PeriodicalIF":3.1000,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics\",\"authors\":\"N. Baghban-Bousari , D. Eric , G. Palau , A. Crespo-Yepes , M. Porti , E. Ramon , S. Ogier , M. Nafria\",\"doi\":\"10.1016/j.mee.2025.112407\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (I<sub>D</sub>) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.</div></div>\",\"PeriodicalId\":18557,\"journal\":{\"name\":\"Microelectronic Engineering\",\"volume\":\"302 \",\"pages\":\"Article 112407\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2025-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronic Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167931725000966\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronic Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167931725000966","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Feasibility of Physical Unclonable Functions from Pre-stressed Organic Thin Film Transistors for Secure Microelectronics
Pre-stressed commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their suitability for Physical Unclonable Functions (PUFs) implementation, when the variability of the drain current (ID) is used as entropy source. Different kinds of electrical pre-stresses have been considered, to study their impact on the PUF reproducibility. Uniqueness and Uniformity of the resulting PUFs have also been evaluated. The proposed pre-stressed OTFTs based PUFs show a reproducibility up to 0.99, with a uniformity and uniqueness of 0.52 and 0.50, respectively.
期刊介绍:
Microelectronic Engineering is the premier nanoprocessing, and nanotechnology journal focusing on fabrication of electronic, photonic, bioelectronic, electromechanic and fluidic devices and systems, and their applications in the broad areas of electronics, photonics, energy, life sciences, and environment. It covers also the expanding interdisciplinary field of "more than Moore" and "beyond Moore" integrated nanoelectronics / photonics and micro-/nano-/bio-systems. Through its unique mixture of peer-reviewed articles, reviews, accelerated publications, short and Technical notes, and the latest research news on key developments, Microelectronic Engineering provides comprehensive coverage of this exciting, interdisciplinary and dynamic new field for researchers in academia and professionals in industry.