用光泵太赫兹探针光谱研究自旋电子太赫兹发射器中的超快电子温度动力学

IF 6.7 1区 物理与天体物理 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Felix Selz*, Johanna Kölbel, Felix Paries, Georg von Freymann, Daniel Molter and Daniel M. Mittleman, 
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引用次数: 0

摘要

飞秒激光泵浦的自旋电子太赫兹发射器(STEs)已成为宽带太赫兹辐射的一种广泛应用的源。然而,发射场的强度在一定程度上受到泵浦波长处光损伤阈值的限制。通过了解自旋电子金属层中的电子温度弛豫,可以改善相变电子束的热管理。在这里,我们使用光泵太赫兹探针光谱在皮秒时间尺度上测量电子温度动力学。我们观察到光泵浦诱导了通过STE的太赫兹传输的变化。利用双温模型分析所得信号,提取出STE的动态电子温度。与其他方法相比,这种方法的优点是避免了探针脉冲对样品的额外加热,使其特别适合于研究累积加热效应,累积加热效应被认为是导致MHz重复率泵浦下光学损伤的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ultrafast Electron Temperature Dynamics in Spintronic Terahertz Emitters Studied by Optical-Pump Terahertz-Probe Spectroscopy

Spintronic terahertz emitters (STEs) pumped by femtosecond lasers have become a widely used source of broadband terahertz radiation. However, the strength of the emitted field is limited in part by the optical damage threshold at the pump wavelength. Thermal management of STEs can be improved by understanding electron temperature relaxation in the spintronic metal layer. Here, we present a measurement of electron temperature dynamics on a picosecond time scale using optical-pump terahertz-probe spectroscopy. We observe that the optical pump induces a change in terahertz transmission through the STE. By analyzing the resulting signal with a two-temperature model, we extract the dynamic electron temperature of the STE. This approach offers an advantage over other methods by avoiding additional heating of the sample by the probe pulse, making it particularly suitable for studying cumulative heating effects, which are believed to contribute to optical damage under MHz repetition rate pumping.

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来源期刊
ACS Photonics
ACS Photonics NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.90
自引率
5.70%
发文量
438
审稿时长
2.3 months
期刊介绍: Published as soon as accepted and summarized in monthly issues, ACS Photonics will publish Research Articles, Letters, Perspectives, and Reviews, to encompass the full scope of published research in this field.
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