{"title":"采用相变材料开关的射频集成无源器件微调","authors":"Kariny Nunes Maia;Audrey Martin;Pierre Blondy","doi":"10.1109/LMWT.2025.3581156","DOIUrl":null,"url":null,"abstract":"This letter presents a phase-change material (PCM) switch-based trimming technique for an radio frequency (RF) <italic>L</i>–<italic>C</i> output matching circuit fabricated on high-resistivity silicon. By leveraging the memory properties of PCM switches, the proposed circuit enables precise postfabrication adjustments to compensating for active device variations. The measured <italic>L</i>–<italic>C</i> circuit inductor is tuned from 1.3 to 1.6 nH by switching its parallel capacitance, while the capacitor is adjusted from 0.7 to 1.2 pF, resulting in four distinct impedance states. The measured total insertion loss ranges from −1.62 to −2.95 dB, showing good agreement with simulations. The complete circuit occupies an area of <inline-formula> <tex-math>$332\\times 363~\\mu $ </tex-math></inline-formula>m<sup>2</sup>, which is nearly identical to its fixed version.","PeriodicalId":73297,"journal":{"name":"IEEE microwave and wireless technology letters","volume":"35 9","pages":"1340-1343"},"PeriodicalIF":3.4000,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"RF Integrated Passive Devices Trimming Using Phase Change Material Switches\",\"authors\":\"Kariny Nunes Maia;Audrey Martin;Pierre Blondy\",\"doi\":\"10.1109/LMWT.2025.3581156\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This letter presents a phase-change material (PCM) switch-based trimming technique for an radio frequency (RF) <italic>L</i>–<italic>C</i> output matching circuit fabricated on high-resistivity silicon. By leveraging the memory properties of PCM switches, the proposed circuit enables precise postfabrication adjustments to compensating for active device variations. The measured <italic>L</i>–<italic>C</i> circuit inductor is tuned from 1.3 to 1.6 nH by switching its parallel capacitance, while the capacitor is adjusted from 0.7 to 1.2 pF, resulting in four distinct impedance states. The measured total insertion loss ranges from −1.62 to −2.95 dB, showing good agreement with simulations. The complete circuit occupies an area of <inline-formula> <tex-math>$332\\\\times 363~\\\\mu $ </tex-math></inline-formula>m<sup>2</sup>, which is nearly identical to its fixed version.\",\"PeriodicalId\":73297,\"journal\":{\"name\":\"IEEE microwave and wireless technology letters\",\"volume\":\"35 9\",\"pages\":\"1340-1343\"},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2025-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE microwave and wireless technology letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11049990/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"0\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE microwave and wireless technology letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11049990/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
RF Integrated Passive Devices Trimming Using Phase Change Material Switches
This letter presents a phase-change material (PCM) switch-based trimming technique for an radio frequency (RF) L–C output matching circuit fabricated on high-resistivity silicon. By leveraging the memory properties of PCM switches, the proposed circuit enables precise postfabrication adjustments to compensating for active device variations. The measured L–C circuit inductor is tuned from 1.3 to 1.6 nH by switching its parallel capacitance, while the capacitor is adjusted from 0.7 to 1.2 pF, resulting in four distinct impedance states. The measured total insertion loss ranges from −1.62 to −2.95 dB, showing good agreement with simulations. The complete circuit occupies an area of $332\times 363~\mu $ m2, which is nearly identical to its fixed version.