{"title":"一般高阶多因子的线性标度律","authors":"Fazhong Shen;Lixin Ran","doi":"10.1109/TMTT.2025.3553119","DOIUrl":null,"url":null,"abstract":"Multipactor discharge is the secondary-electron avalanche possibly occurring in high-power vacuum microwave devices, threatening the long-term reliability of these devices widely used in communication satellites and particle accelerators. Due to the random nature of secondary-electron emissions, the process of multipactor is complicated. Here, we report the emergence of a linear scaling law in this complicated random system. We derived an accurate statistical high-order limit model and found that the model remains the same when the electric field strength is linear with the operating frequency. By observing images of the emission-to-emission conversion rate (EECR) that describes statistical behaviors of the secondary-electron transitions, the mechanism of the scaling law is illustrated. Exampled with three typical devices including the parallel-plate, coaxial, and rectangular waveguides, simulated and experimental results are presented, verifying the validity of the proposed model and the linear scaling law.","PeriodicalId":13272,"journal":{"name":"IEEE Transactions on Microwave Theory and Techniques","volume":"73 9","pages":"6296-6303"},"PeriodicalIF":4.5000,"publicationDate":"2025-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Linear Scaling Law for General High-Order Multipactor\",\"authors\":\"Fazhong Shen;Lixin Ran\",\"doi\":\"10.1109/TMTT.2025.3553119\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Multipactor discharge is the secondary-electron avalanche possibly occurring in high-power vacuum microwave devices, threatening the long-term reliability of these devices widely used in communication satellites and particle accelerators. Due to the random nature of secondary-electron emissions, the process of multipactor is complicated. Here, we report the emergence of a linear scaling law in this complicated random system. We derived an accurate statistical high-order limit model and found that the model remains the same when the electric field strength is linear with the operating frequency. By observing images of the emission-to-emission conversion rate (EECR) that describes statistical behaviors of the secondary-electron transitions, the mechanism of the scaling law is illustrated. Exampled with three typical devices including the parallel-plate, coaxial, and rectangular waveguides, simulated and experimental results are presented, verifying the validity of the proposed model and the linear scaling law.\",\"PeriodicalId\":13272,\"journal\":{\"name\":\"IEEE Transactions on Microwave Theory and Techniques\",\"volume\":\"73 9\",\"pages\":\"6296-6303\"},\"PeriodicalIF\":4.5000,\"publicationDate\":\"2025-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Microwave Theory and Techniques\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10947221/\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Microwave Theory and Techniques","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10947221/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Linear Scaling Law for General High-Order Multipactor
Multipactor discharge is the secondary-electron avalanche possibly occurring in high-power vacuum microwave devices, threatening the long-term reliability of these devices widely used in communication satellites and particle accelerators. Due to the random nature of secondary-electron emissions, the process of multipactor is complicated. Here, we report the emergence of a linear scaling law in this complicated random system. We derived an accurate statistical high-order limit model and found that the model remains the same when the electric field strength is linear with the operating frequency. By observing images of the emission-to-emission conversion rate (EECR) that describes statistical behaviors of the secondary-electron transitions, the mechanism of the scaling law is illustrated. Exampled with three typical devices including the parallel-plate, coaxial, and rectangular waveguides, simulated and experimental results are presented, verifying the validity of the proposed model and the linear scaling law.
期刊介绍:
The IEEE Transactions on Microwave Theory and Techniques focuses on that part of engineering and theory associated with microwave/millimeter-wave components, devices, circuits, and systems involving the generation, modulation, demodulation, control, transmission, and detection of microwave signals. This includes scientific, technical, and industrial, activities. Microwave theory and techniques relates to electromagnetic waves usually in the frequency region between a few MHz and a THz; other spectral regions and wave types are included within the scope of the Society whenever basic microwave theory and techniques can yield useful results. Generally, this occurs in the theory of wave propagation in structures with dimensions comparable to a wavelength, and in the related techniques for analysis and design.