控制低损耗相变材料Sb2S3的结晶动力学

IF 2.8
Felix Hoff, Julian Pries, Jan Köttgen, Pierre Lucas, Matthias Wuttig
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引用次数: 0

摘要

光电子学对于开发节能芯片技术至关重要,相变材料(PCMs)成为光子集成电路中可重构元件(如非易失性移相器)的有前途的候选者。硫化锑(Sb2S3)因其低光学损耗和可观的相移特性以及两相的非挥发性而脱颖而出。本研究表明,通过改变样品的体积尺寸到薄膜尺寸,Sb2S3的结晶动力学可以从生长驱动转变为成核驱动。这种结晶过程的调整对于需要控制部分结晶的光开关应用至关重要。加热速率超过6个数量级的量热测量表明,与传统PCMs在玻璃化转变以下结晶不同,Sb2S3在过冷液体(UCL)相结晶之前表现出可测量的玻璃化转变。等温结晶动力学的研究提供了对成核速率和晶体生长速度的见解,同时证实了在减少薄膜厚度时向成核驱动行为的转变——这是有效器件工程的一个重要方面。Sb2S3与其他PCMs(如GeTe和Ge2Sb2Te5)之间的化学键合机制存在根本差异,前者在两种材料相中都表现出共价键,后者在结晶过程中表现出明显的键合改变。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Controlling the Crystallization Kinetics of Low Loss Phase Change Material Sb2S3

Controlling the Crystallization Kinetics of Low Loss Phase Change Material Sb2S3

Controlling the Crystallization Kinetics of Low Loss Phase Change Material Sb2S3

Controlling the Crystallization Kinetics of Low Loss Phase Change Material Sb2S3

Optoelectronics are crucial for developing energy-efficient chip technology, with phase-change materials (PCMs) emerging as promising candidates for reconfigurable components in photonic integrated circuits, such as nonvolatile phase shifters. Antimony sulfide (Sb2S3) stands out due to its low optical loss and considerable phase-shifting properties, along with the non-volatility of both phases. This study demonstrates that the crystallization kinetics of Sb2S3 can be switched from growth-driven to nucleation-driven by altering the sample dimension from bulk to film. This tuning of the crystallization process is critical for optical switching applications requiring control over partial crystallization. Calorimetric measurements with heating rates spanning over six orders of magnitude, reveal that, unlike conventional PCMs that crystallize below the glass transition, Sb2S3 exhibits a measurable glass transition prior to crystallization from the undercooled liquid (UCL) phase. The investigation of isothermal crystallization kinetics provides insights into nucleation rates and crystal growth velocities while confirming the shift to nucleation-driven behavior at reduced film thicknesses—an essential aspect for effective device engineering. A fundamental difference in chemical bonding mechanisms was identified between Sb2S3, which exhibits covalent bonding in both material phases, and other PCMs, such as GeTe and Ge2Sb2Te5, which demonstrate pronounced bonding alterations upon crystallization.

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