{"title":"封底：通过单路测量概率估算密度矩阵功率减小轨迹的显式公式（adva . Quantum technology . 9/2025）","authors":"Rui-Qi Zhang, Xiao-Qi Liu, Jing Wang, Ming Li, Shu-Qian Shen, Shao-Ming Fei","doi":"10.1002/qute.70010","DOIUrl":null,"url":null,"abstract":"<p>The cover picture shows a controlled SWAP test quantum circuit with several state copies, and bitstrings (e.g., 0000, 1001, 1111) as measurement results. These bitstrings correspond to probabilities to simultaneously estimate traces of the 2nd to nth power traces of reduced density matrices via a single circuit, applied to entanglement measure computation. More in article number 2500376, Ming Li and co-workers.\n\n <figure>\n <div><picture>\n <source></source></picture><p></p>\n </div>\n </figure></p>","PeriodicalId":72073,"journal":{"name":"Advanced quantum technologies","volume":"8 9","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2025-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/qute.70010","citationCount":"0","resultStr":"{\"title\":\"Back Cover: Explicit Formulas for Estimating Trace of Reduced Density Matrix Powers via Single-Circuit Measurement Probabilities (Adv. Quantum Technol. 9/2025)\",\"authors\":\"Rui-Qi Zhang, Xiao-Qi Liu, Jing Wang, Ming Li, Shu-Qian Shen, Shao-Ming Fei\",\"doi\":\"10.1002/qute.70010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The cover picture shows a controlled SWAP test quantum circuit with several state copies, and bitstrings (e.g., 0000, 1001, 1111) as measurement results. These bitstrings correspond to probabilities to simultaneously estimate traces of the 2nd to nth power traces of reduced density matrices via a single circuit, applied to entanglement measure computation. More in article number 2500376, Ming Li and co-workers.\\n\\n <figure>\\n <div><picture>\\n <source></source></picture><p></p>\\n </div>\\n </figure></p>\",\"PeriodicalId\":72073,\"journal\":{\"name\":\"Advanced quantum technologies\",\"volume\":\"8 9\",\"pages\":\"\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://advanced.onlinelibrary.wiley.com/doi/epdf/10.1002/qute.70010\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced quantum technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://advanced.onlinelibrary.wiley.com/doi/10.1002/qute.70010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced quantum technologies","FirstCategoryId":"1085","ListUrlMain":"https://advanced.onlinelibrary.wiley.com/doi/10.1002/qute.70010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Back Cover: Explicit Formulas for Estimating Trace of Reduced Density Matrix Powers via Single-Circuit Measurement Probabilities (Adv. Quantum Technol. 9/2025)
The cover picture shows a controlled SWAP test quantum circuit with several state copies, and bitstrings (e.g., 0000, 1001, 1111) as measurement results. These bitstrings correspond to probabilities to simultaneously estimate traces of the 2nd to nth power traces of reduced density matrices via a single circuit, applied to entanglement measure computation. More in article number 2500376, Ming Li and co-workers.
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