δ σ调制器四阶噪声传递函数的粒子群算法优化

IF 2.5 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Arockia Twinkle J , Srinivasan R , Premanand V. Chandramani
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引用次数: 0

摘要

Delta Sigma Modulator (ΔΣM)具有内置的噪声整形功能,该功能由噪声传递函数(NTF)定义。NTF的优化直接提高了ΔΣM的噪声整形性能和整体性能。该方法采用粒子群算法对NTF进行优化。利用其强大的全局优化能力,粒子群算法有效地导航设计空间,收敛到最优的NTF,产生62.7244 dB的信号量化噪声(SQNR)。此外,利用该NTF合成的前馈级联谐振器(CRFF) ΔΣM的峰值信噪比(SNRp2p)/峰值信噪比(peak SNR)/平均信噪比(peak SNR)分别为92.5 dB/82.9594 dB/82.1 dB,计算复杂度降低。与现有方法相比,该方法在不同过采样比(OSR)值下实现了更高的SQNR ×过载水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimization of fourth order noise transfer function using PSO algorithm for delta sigma modulator
Delta Sigma Modulator (ΔΣM) has in-built noise shaping feature, which is defined by Noise Transfer Function (NTF). Optimization of NTF directly improves the noise shaping property of the ΔΣM and its overall performance. The proposed method employs PSO algorithm for optimizing the NTF. By utilizing its robust global optimization abilities, the PSO algorithm efficiently navigates the design space, converging on optimal NTF that yields Signal to Quantization Noise (SQNR) of 62.7244 dB. Additionally, Cascade of Resonators with Feed-Forward (CRFF) ΔΣM synthesized with the proposed NTF achieves peak-to-peak SNR (SNRp2p)/peak signal-to-noise ratio (Peak SNR)/average SNR (Peak SNR) of 92.5 dB/82.9594 dB/82.1 dB with reduced computational complexity. The proposed method achieves higher SQNR × Over load level for different Oversampling Ratio (OSR) values when compared to the existing methods.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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