Computer Diffraction Tomography. Digital Image Processing and Analysis Based on the 1D-, 2D-Sized Guided and Wavelet-Function Filter Processing

The results of computer processing for plane-wave X-ray topography imaging of a Coulomb-type point defect in a Si(111) crystal, recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechies atomic function, are presented and analyzed. The topography image filtering efficiency is determined by the parameter of the relative square deviations (averaged over all pixels) of the pixel intensities (RMS) of the processed and reference (noise-free) 2D images. Practical methods for selecting filtration parameters are proposed, with the aid of which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their subsequent use for the 3D digital recovering of nanosized crystal defects.