紫外和可见光辐射对二氧化硅和氧化锌双层中空颗粒涂层光学性能的影响

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
D. S. Fedosov, V. V. Neshchimenko, M. M. Mikhailov, S. A. Yuryev
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引用次数: 0

摘要

对比分析了聚甲基苯基硅氧烷树脂涂层与两层空心粒子ZnO/SiO2和SiO2/ZnO颜料粉末辐照后200 ~ 2500 nm范围内的原位漫反射光谱变化。使用模拟太阳辐射光谱的氙灯进行照射,强度为3 e.s.i.(相当于太阳辐照度,1 e.s.i. = 0.139 W/cm2)。通过对未辐照和辐照样品的漫反射光谱差值的分析,估计了基于两层空心ZnO/SiO2和SiO2/ZnO颗粒的涂层相对于基于ZnO多晶的涂层的光稳定性。研究发现,ZnO/SiO2和SiO2/ZnO空心粒子涂层的诱导吸收带强度低于ZnO微粒涂层,并且在评估太阳吸收率变化时的抗辐射能力(ΔαS)是ZnO微粒涂层的两倍。光稳定性的提高可能是由缺陷积累的不同性质决定的:对于块状微粒,辐射缺陷可以在颗粒内部积累,而对于空心微粒,缺陷的积累只能发生在球体的薄壳内。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Influence of UV and Visible Radiation on Optical Properties of Coatings Based on Two-Layer Hollow Particles of Silicon Dioxide and Zinc Oxide

Influence of UV and Visible Radiation on Optical Properties of Coatings Based on Two-Layer Hollow Particles of Silicon Dioxide and Zinc Oxide

Influence of UV and Visible Radiation on Optical Properties of Coatings Based on Two-Layer Hollow Particles of Silicon Dioxide and Zinc Oxide

A comparative analysis of in situ diffuse reflection spectra in the range from 200 to 2500 nm and their changes after irradiation of coatings based on polymethylphenylsiloxane resin and pigment powders of two-layer hollow particles ZnO/SiO2 and SiO2/ZnO was carried out. Irradiation was performed with light from a xenon arc lamp simulating the solar radiation spectrum, with an intensity of 3 e.s.i. (equivalent of solar irradiance, 1 e.s.i. = 0.139 W/cm2). The photostability of the studied coatings based on two-layer hollow ZnO/SiO2 and SiO2/ZnO particles was estimated relative to coatings based on ZnO polycrystals from an analysis of the difference diffuse reflection spectra obtained by subtracting the spectra of unirradiated and irradiated samples. It has been found that the intensity of the induced absorption bands in coatings based on ZnO/SiO2 and SiO2/ZnO hollow particles is lower than that in coatings based on ZnO microparticles and the radiation resistance when assessing changes in solar absorptance (ΔαS) is twice as high. The increase in photostability is probably determined by the different nature of defect accumulation: for bulk microparticles, radiation defects can accumulate inside the grains, while in hollow particles, the accumulation of defects can occur only within the thin shell of the sphere.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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