{"title":"二维曲线相边界上线张力的尺寸依赖性","authors":"M. A. Shebzukhova, K. Ch. Bzhikhatlov","doi":"10.1134/S1027451025700715","DOIUrl":null,"url":null,"abstract":"<p>In the framework of thermodynamics of surface and interphase boundaries, an equation is obtained for the dependence of linear tension on the radius of the tension line at the boundary of two-dimensional phases located on a flat surface and separated by a curved line. According to the obtained relationship, calculations have been carried out and the required dependence has been constructed in dimensionless coordinates (<span>\\({\\tau \\mathord{\\left/ {\\vphantom {\\tau {{{\\tau }_{\\infty }}}}} \\right. \\kern-0em} {{{\\tau }_{\\infty }}}}\\)</span> and <span>\\({r \\mathord{\\left/ {\\vphantom {r {{{\\delta }_{\\tau }}}}} \\right. \\kern-0em} {{{\\delta }_{\\tau }}}}\\)</span>), which is of a universal nature and does not depend on the specific nature of two-dimensional phases. The obtained curve is also of the universal nature according to the type of two-dimensional interface (liquid–vapor, solid–vapor, solid–liquid, solid–solid). In this work, a comparison is made with the solution of a similar problem of finding the dimensional dependence of surface tension on the nanoparticle size σ(<i>r</i>) for the cases of positive and negative curvature considered by the authors earlier.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 2","pages":"481 - 485"},"PeriodicalIF":0.4000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Size Dependence of Linear Tension at a Curved Two-Dimensional Phase Boundary\",\"authors\":\"M. A. Shebzukhova, K. Ch. Bzhikhatlov\",\"doi\":\"10.1134/S1027451025700715\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>In the framework of thermodynamics of surface and interphase boundaries, an equation is obtained for the dependence of linear tension on the radius of the tension line at the boundary of two-dimensional phases located on a flat surface and separated by a curved line. According to the obtained relationship, calculations have been carried out and the required dependence has been constructed in dimensionless coordinates (<span>\\\\({\\\\tau \\\\mathord{\\\\left/ {\\\\vphantom {\\\\tau {{{\\\\tau }_{\\\\infty }}}}} \\\\right. \\\\kern-0em} {{{\\\\tau }_{\\\\infty }}}}\\\\)</span> and <span>\\\\({r \\\\mathord{\\\\left/ {\\\\vphantom {r {{{\\\\delta }_{\\\\tau }}}}} \\\\right. \\\\kern-0em} {{{\\\\delta }_{\\\\tau }}}}\\\\)</span>), which is of a universal nature and does not depend on the specific nature of two-dimensional phases. The obtained curve is also of the universal nature according to the type of two-dimensional interface (liquid–vapor, solid–vapor, solid–liquid, solid–solid). In this work, a comparison is made with the solution of a similar problem of finding the dimensional dependence of surface tension on the nanoparticle size σ(<i>r</i>) for the cases of positive and negative curvature considered by the authors earlier.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"19 2\",\"pages\":\"481 - 485\"},\"PeriodicalIF\":0.4000,\"publicationDate\":\"2025-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451025700715\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700715","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
Size Dependence of Linear Tension at a Curved Two-Dimensional Phase Boundary
In the framework of thermodynamics of surface and interphase boundaries, an equation is obtained for the dependence of linear tension on the radius of the tension line at the boundary of two-dimensional phases located on a flat surface and separated by a curved line. According to the obtained relationship, calculations have been carried out and the required dependence has been constructed in dimensionless coordinates (\({\tau \mathord{\left/ {\vphantom {\tau {{{\tau }_{\infty }}}}} \right. \kern-0em} {{{\tau }_{\infty }}}}\) and \({r \mathord{\left/ {\vphantom {r {{{\delta }_{\tau }}}}} \right. \kern-0em} {{{\delta }_{\tau }}}}\)), which is of a universal nature and does not depend on the specific nature of two-dimensional phases. The obtained curve is also of the universal nature according to the type of two-dimensional interface (liquid–vapor, solid–vapor, solid–liquid, solid–solid). In this work, a comparison is made with the solution of a similar problem of finding the dimensional dependence of surface tension on the nanoparticle size σ(r) for the cases of positive and negative curvature considered by the authors earlier.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.