R. Kh. Khisamov, N. N. Andrianova, A. M. Borisov, M. A. Ovchinnikov, I. I. Musabirov, R. R. Timiryaev, R. R. Mulyukov
{"title":"30 kev He+离子注入对钨表面起泡形成的结构抑制","authors":"R. Kh. Khisamov, N. N. Andrianova, A. M. Borisov, M. A. Ovchinnikov, I. I. Musabirov, R. R. Timiryaev, R. R. Mulyukov","doi":"10.1134/S1027451025700740","DOIUrl":null,"url":null,"abstract":"<p>The effect of ultrafine-grained structure and cone-shaped surface morphology on the formation of blisters under the irradiation of tungsten with He<sup>+</sup> ions at an energy of 30 keV is studied. In comparative experiments, ultrafine-grained and fine-grained samples with an average grain size of 300 nm and 7 μm, respectively, with smooth and cone-shaped surface morphology are used. The ultrafine-grained structure in tungsten samples is obtained by severe plastic deformation, and the cone-shaped surface morphology is obtained by high-fluence irradiation with Ar<sup>+</sup> ions at an energy of 30 keV. It is found that blisters are formed on both the fine-grained and ultrafine-grained samples when irradiated with He<sup>+</sup> ions at a fluence of 10<sup>18</sup> ion/cm<sup>2</sup>. On the fine-grained samples, some of the blisters are without caps, while in the ultrafine-grained samples, all blisters are intact. The thickness of the caps and the diameter of the blisters depend on the grain size. The cone-shaped surface morphology on ultrafine-grained tungsten is found to suppress blister formation.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 2","pages":"497 - 503"},"PeriodicalIF":0.4000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural Suppression of Blister Formation on the Surface of Tungsten under 30-keV He+-Ion Implantation\",\"authors\":\"R. Kh. Khisamov, N. N. Andrianova, A. M. Borisov, M. A. Ovchinnikov, I. I. Musabirov, R. R. Timiryaev, R. R. Mulyukov\",\"doi\":\"10.1134/S1027451025700740\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The effect of ultrafine-grained structure and cone-shaped surface morphology on the formation of blisters under the irradiation of tungsten with He<sup>+</sup> ions at an energy of 30 keV is studied. In comparative experiments, ultrafine-grained and fine-grained samples with an average grain size of 300 nm and 7 μm, respectively, with smooth and cone-shaped surface morphology are used. The ultrafine-grained structure in tungsten samples is obtained by severe plastic deformation, and the cone-shaped surface morphology is obtained by high-fluence irradiation with Ar<sup>+</sup> ions at an energy of 30 keV. It is found that blisters are formed on both the fine-grained and ultrafine-grained samples when irradiated with He<sup>+</sup> ions at a fluence of 10<sup>18</sup> ion/cm<sup>2</sup>. On the fine-grained samples, some of the blisters are without caps, while in the ultrafine-grained samples, all blisters are intact. The thickness of the caps and the diameter of the blisters depend on the grain size. The cone-shaped surface morphology on ultrafine-grained tungsten is found to suppress blister formation.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"19 2\",\"pages\":\"497 - 503\"},\"PeriodicalIF\":0.4000,\"publicationDate\":\"2025-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451025700740\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700740","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
Structural Suppression of Blister Formation on the Surface of Tungsten under 30-keV He+-Ion Implantation
The effect of ultrafine-grained structure and cone-shaped surface morphology on the formation of blisters under the irradiation of tungsten with He+ ions at an energy of 30 keV is studied. In comparative experiments, ultrafine-grained and fine-grained samples with an average grain size of 300 nm and 7 μm, respectively, with smooth and cone-shaped surface morphology are used. The ultrafine-grained structure in tungsten samples is obtained by severe plastic deformation, and the cone-shaped surface morphology is obtained by high-fluence irradiation with Ar+ ions at an energy of 30 keV. It is found that blisters are formed on both the fine-grained and ultrafine-grained samples when irradiated with He+ ions at a fluence of 1018 ion/cm2. On the fine-grained samples, some of the blisters are without caps, while in the ultrafine-grained samples, all blisters are intact. The thickness of the caps and the diameter of the blisters depend on the grain size. The cone-shaped surface morphology on ultrafine-grained tungsten is found to suppress blister formation.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.