M. V. Soloninkina, D. V. Loginov, S. A. Moshkalev, N. N. Rozhkova
{"title":"用x射线衍射、扫描电子显微镜和热重分析同时差示扫描量热法分析巴西石墨结构","authors":"M. V. Soloninkina, D. V. Loginov, S. A. Moshkalev, N. N. Rozhkova","doi":"10.1134/S1027451025700594","DOIUrl":null,"url":null,"abstract":"<p>The results on X-ray analysis of Brazilian graphite sample are presented. During diffraction pattern indexing and qualitative X-ray phase analysis, it has been found that Brazilian graphite contains three phases of carbon, two of which belong to hexagonal graphite (α-graphite) and one to rhombohedral graphite (β‑graphite), which is confirmed by simultaneous thermal analysis. The unit cell parameters of each phase have been determined and refined. Calculations of conditional phase concentrations in the sample by the least squares method have shown that the conditional concentration of 47-1155 standard (JCPDS database) in the sample is 66%, 1-646 standard is 21.3%, and 2-456 standard is 12.6%. Using scanning electron microscopy, the sample surface topology has been found to be is a flake structure with a large number of particles, the size of which does not exceed 5 μm. The quantitative characteristics of the short-range order have been determined, which have shown that the structure of Brazilian graphite is close to that of hexagonal graphite within the error limits.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 2","pages":"405 - 412"},"PeriodicalIF":0.4000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural Analysis of Brazilian Graphite by X-ray Diffraction, Scanning Electron Microscopy, and Thermogravimetric Analysis with Simultaneous Differential Scanning Calorimetry\",\"authors\":\"M. V. Soloninkina, D. V. Loginov, S. A. Moshkalev, N. N. Rozhkova\",\"doi\":\"10.1134/S1027451025700594\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The results on X-ray analysis of Brazilian graphite sample are presented. During diffraction pattern indexing and qualitative X-ray phase analysis, it has been found that Brazilian graphite contains three phases of carbon, two of which belong to hexagonal graphite (α-graphite) and one to rhombohedral graphite (β‑graphite), which is confirmed by simultaneous thermal analysis. The unit cell parameters of each phase have been determined and refined. Calculations of conditional phase concentrations in the sample by the least squares method have shown that the conditional concentration of 47-1155 standard (JCPDS database) in the sample is 66%, 1-646 standard is 21.3%, and 2-456 standard is 12.6%. Using scanning electron microscopy, the sample surface topology has been found to be is a flake structure with a large number of particles, the size of which does not exceed 5 μm. The quantitative characteristics of the short-range order have been determined, which have shown that the structure of Brazilian graphite is close to that of hexagonal graphite within the error limits.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"19 2\",\"pages\":\"405 - 412\"},\"PeriodicalIF\":0.4000,\"publicationDate\":\"2025-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451025700594\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700594","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
Structural Analysis of Brazilian Graphite by X-ray Diffraction, Scanning Electron Microscopy, and Thermogravimetric Analysis with Simultaneous Differential Scanning Calorimetry
The results on X-ray analysis of Brazilian graphite sample are presented. During diffraction pattern indexing and qualitative X-ray phase analysis, it has been found that Brazilian graphite contains three phases of carbon, two of which belong to hexagonal graphite (α-graphite) and one to rhombohedral graphite (β‑graphite), which is confirmed by simultaneous thermal analysis. The unit cell parameters of each phase have been determined and refined. Calculations of conditional phase concentrations in the sample by the least squares method have shown that the conditional concentration of 47-1155 standard (JCPDS database) in the sample is 66%, 1-646 standard is 21.3%, and 2-456 standard is 12.6%. Using scanning electron microscopy, the sample surface topology has been found to be is a flake structure with a large number of particles, the size of which does not exceed 5 μm. The quantitative characteristics of the short-range order have been determined, which have shown that the structure of Brazilian graphite is close to that of hexagonal graphite within the error limits.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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