A novel nonlinear stability modeling of mechanical-electro-carrier coupling piezoelectric semiconductor cylindrical shells

Piezoelectric semiconductors (PS) shell-like structures have great potential for the manufacture of innovative devices, such as nano sensors. To evaluate stability of such devices, a novel mechanical-electro-carrier (MEC) coupling PS cylindrical shell (PSCS) post-buckling model is developed based on the high-order shear deformation shell theory (HSDT). By applying the Galerkin technique in conjunction with newly developed trial functions, the mode-jumping equilibrium path, post-buckling deformation, distributions of electron concentration and electric potential are determined. The effects of crucial influencing parameters, including geometrical parameters, semiconductors constants and voltages on nonlinear stability of PSCS, are explored. Numerical findings reveal that, as a consequence of the MEC coupling effect, both the bifurcation point (first buckling) and load-bearing capacity of PSCS are reduced compared to those of classical piezoelectric counterpart.