实际工业场景中基于多驱动器件外部参数的IGBT结温估计

IF 1.6 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Chenglang Su, Wei Jiang, Zhicong Huang
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引用次数: 0

摘要

绝缘栅双极晶体管(IGBT)是电力电子学中最重要的功率半导体器件之一,也是一个容易发生故障的器件。IGBT结温过高和结温波动是导致IGBT模块老化失效的主要原因。对IGBT模块结温进行高精度监测是进行IGBT寿命预测的前提,对降低维护成本和提高设备可靠性至关重要。为此,提出了一种基于LSTM神经网络和滑动窗口估计模型的IGBT结温估计方法,并将其应用于实际工业场景。该方法以实际工业应用场景中电机驱动装置的运行数据作为训练和测试数据集,利用IGBT模块的外部运行参数来估算IGBT模块的结温。与基于开关暂态的IGBT模块内部工作参数相比,外部工作参数更容易采集和处理,更适合实际应用场景。提出了一种滑动窗口估计模型来估计IGBT模块的结温。与点对点估计方法相比,滑动窗口估计方法能更好地捕捉历史运行数据的影响,具有更高的时间序列数据估计能力。采用LSTM神经网络实现滑动窗的IGBT结温估计,更适合于实际工业场景下的时间序列估计。实验结果表明,滑动窗估计方法的估计精度优于点对点估计方法,基于LSTM的滑动窗估计方法的估计精度优于基于其他机器学习模型的滑动窗估计方法。实验证明,该方法能较好地捕捉系统的动态过程,具有较高的估计精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

IGBT Junction Temperature Estimation Based on External Parameters of Multiple Drive Devices in Practical Industrial Scenario

IGBT Junction Temperature Estimation Based on External Parameters of Multiple Drive Devices in Practical Industrial Scenario

The insulated gate bipolar transistor (IGBT) is one of the most important power semiconductor devices in power electronics and is also prone to failure. High junction temperature and junction temperature fluctuation of IGBT are the main causes of IGBT module aging failure. The high-precision monitoring of the junction temperature of the IGBT module is a prerequisite for IGBT life prediction, which is crucial for reducing maintenance costs and improving equipment reliability. Therefore, an IGBT junction temperature estimation method based on long short-term memory (LSTM) neural network and sliding window estimation model is proposed and applied in practical industrial scenarios. This method uses the operating data of the motor drive device in the actual industrial application scenario as the training and test data set and uses the external operating parameters of the IGBT module to estimate the junction temperature of the IGBT module. Compared with the internal operating parameters of the IGBT module based on switching transient, the external operating parameters are easier to collect and process, and more suitable for practical application scenes. A sliding window estimation model is proposed to estimate the junction temperature of the IGBT module. Compared with the point-to-point estimation method, the sliding window estimation method can capture the influence of historical operation data better and has a higher capability of time series data estimation. The IGBT junction temperature estimation of sliding windows is realized by the LSTM neural network, which is more suitable for time series estimation in real industrial scenarios. The experimental results show that the estimation accuracy of the sliding window estimation method is better than that of the point-to-point estimation method, and the accuracy of the sliding window estimation method based on LSTM is better than that of the sliding window estimation method based on other machine learning models. It proves that the proposed method can better capture the dynamic process of the system and has higher estimation accuracy.

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来源期刊
International Journal of Circuit Theory and Applications
International Journal of Circuit Theory and Applications 工程技术-工程:电子与电气
CiteScore
3.60
自引率
34.80%
发文量
277
审稿时长
4.5 months
期刊介绍: The scope of the Journal comprises all aspects of the theory and design of analog and digital circuits together with the application of the ideas and techniques of circuit theory in other fields of science and engineering. Examples of the areas covered include: Fundamental Circuit Theory together with its mathematical and computational aspects; Circuit modeling of devices; Synthesis and design of filters and active circuits; Neural networks; Nonlinear and chaotic circuits; Signal processing and VLSI; Distributed, switched and digital circuits; Power electronics; Solid state devices. Contributions to CAD and simulation are welcome.
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