一种双模二维扫频微带周期性漏波天线阵列

IF 4.8 2区计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Antennas and Wireless Propagation Letters Pub Date : 2025-06-24 DOI:10.1109/LAWP.2025.3582781

Xiangqi Nie;Yuanxin Li;Zhixi Liang;Shao Yong Zheng;Yunliang Long

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引用次数: 0

摘要

提出了一种双模二维扫描频率微带周期漏波天线阵列。天线阵列由四条具有一维扫描能力的壁垒线和匹配馈电结构组成。天线阵列具有双模二维频率扫描能力。在低频范围内，天线阵列处于四波束扫描模式，随着频率的增加，四波束逐渐向宽频方向移动。在高频范围内，天线阵列呈碗状辐射模式，随着频率的增加，碗状辐射逐渐远离宽频方向。制作了天线阵样机并进行了测试。测量结果验证了天线阵列实现了双模二维扫频。在低频范围内，四束辐射在$\varphi $ = 45°平面上从8°到49°扫描。在高频范围内，碗状辐射在$\varphi $ = 0°（x-z）平面上扫描17°至38°。

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A Dual-Mode 2-D Frequency-Scanning Microstrip Periodic Leaky-Wave Antenna Array

A dual-mode two-dimensional (2-D) frequency-scanning microstrip periodic leaky-wave antenna array is presented. The antenna array consists of four rampart lines with 1-D frequency-scanning capability and a matching feeding structure. The antenna array has dual-mode 2-D frequency-scanning capability. In the low-frequency range, the antenna array is in a four-beam scanning mode, and as the frequency increases, the four beams gradually move toward the broadside direction. In the high-frequency range, the antenna array is in a bowl-shaped radiation mode, and as the frequency increases, the bowl-shaped radiation gradually moves away from the broadside direction. A prototype of antenna array is fabricated and tested. The measurement results verify that the antenna array achieves dual-mode 2-D frequency scanning. In the low-frequency range, the four beam radiation scans from 8° to 49° in the

$\varphi $

= 45° plane. The bowl-shaped radiation in the high-frequency range scans from 17° to 38° in the

$\varphi $

= 0°(x-z)-plane.

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来源期刊

IEEE Antennas and Wireless Propagation Letters 工程技术-电信学

CiteScore

8.00

自引率

9.50%

发文量

529

审稿时长

1.0 months

期刊介绍： IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.