Shoubin Zhang;Hongjun Wang;Zhexian Shen;Chao Chang;Xinhao Li
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引用次数: 0
摘要
路径损耗指数(PLE)是表征信道衰减特性的关键参数之一。现有的PLE估计策略多考虑自由空间传输场景,依赖于收发端之间的信息交换。这些方法都有局限性,比如成本高、安全性低、对复杂环境考虑不足。本文基于(Hu 2024)建立的无线随机网络中的几何路径损耗分布模型,在考虑阴影效应且不考虑发射机位置的情况下,对PLE和阴影方差进行了联合分析和估计。首先,用极大似然估计来表述目标函数。由于目标函数混合二阶特性的复杂性,对目标函数相对于各变量的一阶和二阶特性进行了顺序分析。最后,通过大量的仿真实验和与cram r - rao下界的比较,验证了理论分析与实验结果的一致性和有效性。
Transmitter Location-Independent Path Loss Exponent Estimation via RSS Measurements With Shadowing Effect
Path loss exponent (PLE) is one of the key parameters that characterizes the channel attenuation properties. Existing estimation strategies for PLE mostly consider scenarios of free-space transmission and rely on information exchange between transmitters and receivers. These approaches have limitations, such as high costs, low security, and insufficient consideration of complex environments. This letter, based on the geometric path loss distribution model in wireless random networks established in (Hu 2024), implements a joint analysis and estimation of PLE and shadowing variance, taking into account shadowing effects and without transmitter’s location. First, the objective function is formulated using maximum likelihood estimation. Due to the complexity of the objective function’s mixed second-order characteristics, the first-order and second-order properties of the objective function with respect to each variable are analyzed sequentially. Finally, through extensive simulation experiments and comparisons with Cramér–Rao lower bound, the consistency and effectiveness of the theoretical analysis and experimental results are verified.
期刊介绍:
IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.