基于对称破缺效应的双频高增益超表面天线用于雷达成像

IF 4.8 2区计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Antennas and Wireless Propagation Letters Pub Date : 2025-06-03 DOI:10.1109/LAWP.2025.3576136

Wufu Zhu;Jiabin Yu;Hongmei Mi;Lihua Xiao;Dongping Zhang;Binggang Xiao

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引用次数: 0

摘要

本文提出了一种基于对称破溃效应的双频高增益超表面（MTS）天线用于雷达成像。顶层MTS包括中心矩形片和三角形片，而馈电结构包括微带线和地槽。通过引入对称破缺效应，消除了辐射盲区，t形馈线在鼓形槽内激发半槽全波长共振模式，实现双频工作。2 × 2天线阵列的带宽分别为7.5 GHz ~ 8.7 GHz和10.1 GHz ~ 12.2 GHz，峰值增益分别为13.9 dBi和11.9 dBi。该天线为双频操作提供了一种紧凑、高性能的解决方案，特别适用于需要多波段操作和高分辨率探测的雷达成像系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Dual-Band High-Gain Metasurface Antenna Based on Symmetry Breaking Effect for Radar Imaging

In this letter, a dual-band high-gain metasurface (MTS) antenna based on the symmetry-breaking effect is proposed for radar imaging. The top-layer MTS comprises a central rectangular patch and triangular patches, while the feed structure includes a microstrip line and a ground slot. By introducing the symmetry-breaking effect, radiation blind zones are eliminated, and the T-shaped feedline excites a half-slot full-wavelength resonance mode in the drum-shaped slot, enabling dual-band operation. A 2 × 2 antenna array achieves bandwidths of 7.5 GHz to 8.7 GHz and 10.1 GHz to 12.2 GHz, with peak gains of 13.9 dBi and 11.9 dBi. The proposed antenna offers a compact, high-performance solution for dual-band operation, particularly suited to radar imaging systems requiring multiband operation and high-resolution detection across diverse scenarios.

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来源期刊

IEEE Antennas and Wireless Propagation Letters 工程技术-电信学

CiteScore

8.00

自引率

9.50%

发文量

529

审稿时长

1.0 months

期刊介绍： IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.